Ferroelectric switching by the grounded scanning probe microscopy tip

Polarization reversal in ferroelectrics by the tip of a scanning probe microscope (SPM) has been intensively studied over the last two decades. In addition to classical domain formation and growth, a number of abnormal switching phenomena have been reported. In particular, it was experimentally and theoretically shown that slow dynamics of surface screening can control the kinetics of the ferroelectric switching, and result in backswitching and relaxation phenomena. Here we experimentally demonstrate the practical possibility of the history dependent polarization reversal by the grounded SPM tip. This phenomenon was attributed to the induction of the slowly dissipating charges into the surface, which in the presence of the grounded tip induce polarization reversal. Analytical and numerical electrostatic calculations allow additional insight into the mechanisms of the observed phenomena.