Abstract
Recent developments in ferroelectric films have been made in terms of their application in nonvolatile memories and dynamic random access memories. One highlight is the report of a complete description of the temperature-dependent dielectric behavior of (Ba,Sr)TiO3 films as a function of strain, composition, and thickness. For the first time, a direct link has been made between the thin film and bulk electrical properties.
| Original language | English |
|---|---|
| Pages (from-to) | 39-44 |
| Number of pages | 6 |
| Journal | Current Opinion in Solid State and Materials Science |
| Volume | 4 |
| Issue number | 1 |
| DOIs | |
| State | Published - Feb 1999 |
| Externally published | Yes |
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