Abstract
Transitions from three-dimensional (3D) hybrid organic-inorganic perovskite (HOIP) structures to lower dimensions including 2D and quasi-2D structures open a new range of functional properties in these materials systems. Yet, the performance of solar cells made from 2D HOIP is below that of the 3D compositions due to the higher band-gap energy, low carrier concentration, and anisotropy in charge transport. Controlling ferroelectricity in 2D HOIPs is considered to be a powerful strategy to drive the spatial separation of photogenerated charge carriers to improve the photovoltaic action in this class of HOIPs. Here, we explore the strain-dependent ferroelectricity and charge carrier properties in strain-engineered 2D-layered HOIPs utilizing advanced scanning probe microscopy (SPM) techniques. Band excitation-piezoresponse force microscopy (BE-PFM) and contact Kelvin probe force microscopy (cKPFM) reveal ferroelectric domains and switchable dynamics with significantly low switching voltages in the low-strain film. Photoluminescence (PL) spectroscopy shows strain-dependent optical properties and a noncentrosymmetric structure with strong second-harmonic generation (SHG) peaks in the low-strain film. In addition, KPFM results demonstrate a higher surface potential in the low-strain films, while the photovoltage and local current are the highest on the high-strain film. Our study demonstrates the critical role of strain engineering on the electromechanical and charge carrier dynamics in 2D HOIPs, which is important for development of 2D HOIP devices.
Original language | English |
---|---|
Pages (from-to) | 4077-4088 |
Number of pages | 12 |
Journal | Chemistry of Materials |
Volume | 33 |
Issue number | 11 |
DOIs | |
State | Published - Jun 8 2021 |
Funding
D.K. and M.A. acknowledge support from the CNMS user facility, project no. CNMS2019-272. Y.L. and O.S.O. acknowledge support from the Center for Nanophase Materials Sciences, which is a US DOE Office of Science User Facility. S.V.K. (data interpretation and analytics) acknowledges support of the 3DFeM EFRC center. XRD was performed at the Joint Institute for Advanced Materials (JIAM) Diffraction Facility, located at the University of Tennessee, Knoxville.
Funders | Funder number |
---|---|
3DFeM EFRC | |
Center for Nanophase Materials Sciences | |
Office of Science | |
University of Tennessee |