Abstract
As power densification demands are placing electronic packages under greater reliability risk, the consequence of complementary or interacting stresses in producing failure are becoming increasingly significant. As such, it is important that reliability methods and package designs consider how multiple-stress interactions may impact product life. Here, the coordination between a novel accelerated testing method and electronic design automation efforts has demonstrated a successful optimization approach for a wire-bonded 2D module layout combining failure mechanisms of electromigration and mechanical stressing. Utilizing custom, physics-of-failure approaches in accelerated testing, interactions can be observed in failure acceleration, which then can be incorporated into design for reliability (DfR) optimization tools. The PowerSynth 2 platform has been utilized as a design for reliability tool to perform a rapid relative reliability evaluation incorporating multi-stress scenarios. This work demonstrates the value added to reliability evaluation techniques when accounting for interacting failure mechanisms and suggests that next generation power devices consider these effects in lifetime estimation.
| Original language | English |
|---|---|
| Pages (from-to) | 27-31 |
| Number of pages | 5 |
| Journal | Advancing Microelectronics |
| Volume | 2023 |
| DOIs | |
| State | Published - Oct 17 2023 |
| Externally published | Yes |
Funding
The authors would like to thank the Office of Naval Research, National Science Foundation, and University of Arkansas for funding and facility access for the completion of this work. This material is based upon work supported by the Office of Naval Research (ONR) under Contract No. FA9550-21-1-0205 and the National Science Foundation (NSF) under Grant No. 2014-00555-04. Any opinions, findings, and conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the Office of Naval Research or National Science Foundation.
Keywords
- Accelerated testing
- Design automation
- Design for reliability
- Interacting failure mechanisms
- Layout optimization
- Power electronics