Facility implementation and comparative performance evaluation of probe-corrected TEM/STEM with schottky and cold field emission illumination

Yan Xin, John Kynoch, Ke Han, Zhiyong Liang, Peter J. Lee, David C. Larbalestier, Yi Feng Su, Kohei Nagahata, Toshihiro Aoki, Paolo Longo

Research output: Contribution to journalArticlepeer-review

9 Scopus citations

Abstract

We report the installation and performance evaluation of a probe aberration-corrected high-resolution JEOL JEM-ARM200F transmission electron microscope (TEM). We provide details on construction of the room that enables us to obtain scanning transmission electron microscope (STEM) data without any evident distortions/noise from the external environment. The microscope routinely delivers expected performance. We show that the highest STEM spatial resolution and energy resolution achieved with this microscope are 0.078 nm and 0.34 eV, respectively. We report a direct comparative evaluation of the performance of this microscope with a Schottky thermal field-emission gun versus a cold field-emission gun. Cold field-emission illumination improves spatial resolution of the high current probe for analytical spectroscopy, the TEM information limit, and the electron energy resolution compared to the Schottky thermal field-emission source.

Original languageEnglish
Pages (from-to)487-495
Number of pages9
JournalMicroscopy and Microanalysis
Volume19
Issue number2
DOIs
StatePublished - Apr 2013
Externally publishedYes

Keywords

  • JEM-ARM200cF.
  • STEM.
  • aberration corrected.
  • cold FEG
  • thermal FEG.

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