Original language | English |
---|---|
Pages (from-to) | 1022-1023 |
Number of pages | 2 |
Journal | Microscopy and Microanalysis |
Volume | 14 |
Issue number | SUPPL. 2 |
DOIs | |
State | Published - Aug 2008 |
Fabricating atom probe tomography specimens from TEM foils
M. K. Miller, K. F. Russell, D. T. Hoelzer
Research output: Contribution to journal › Article › peer-review
3
Scopus
citations