Extracting information content within noisy, sampled profile data from charged particle beams: Part II

C. K. Allen, W. Blokland, S. M. Cousineau, J. D. Galambos

Research output: Contribution to conferencePaperpeer-review

Abstract

This is a continuation of work in [1]. The objective is to design a robust procedure for automating the analysis of beam profile data. In particular, we wish to extract accurate values for the beam position and beam size from profile data sets. These values may be then used to estimate additional beam characteristics such as the Courant-Snyder parameters.

Original languageEnglish
Pages612-614
Number of pages3
StatePublished - 2009
Event24th International Linear Accelerator Conference, LINAC 2008 - Victoria, BC, Canada
Duration: Sep 29 2008Oct 3 2008

Conference

Conference24th International Linear Accelerator Conference, LINAC 2008
Country/TerritoryCanada
CityVictoria, BC
Period09/29/0810/3/08

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