Extracting information content within noisy, sampled profile data from charged particle beams

C. K. Allen; W. Blokland; S. M. Cousineau; J. D. Galambos

Extracting information content within noisy, sampled profile data from charged particle beams

C. K. Allen, W. Blokland, S. M. Cousineau, J. D. Galambos

Research output: Contribution to conference › Paper › peer-review

Abstract

Profile diagnostic devices for Charged-particle beams diagnostic provide data sets describing the one-dimensional density distributions at particular locations. We explore requirements and methods computation of beam position and size from profile data. Typically these data require subjective, human, processing to extract meaningful results, which is inefficient and labor intensive. Our goal is to automate such computations, or at least streamline the process.

Original language	English
Pages	479-481
Number of pages	3
State	Published - 2008
Event	42nd ICFA Advanced Beam Dynamics Workshop on High-Intensity, High-Brightness Hadron Beams, HB 2008 - Nashville, TN, United States Duration: Aug 25 2008 → Aug 29 2008

Conference

Conference	42nd ICFA Advanced Beam Dynamics Workshop on High-Intensity, High-Brightness Hadron Beams, HB 2008
Country/Territory	United States
City	Nashville, TN
Period	08/25/08 → 08/29/08

Cite this

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title = "Extracting information content within noisy, sampled profile data from charged particle beams",

abstract = "Profile diagnostic devices for Charged-particle beams diagnostic provide data sets describing the one-dimensional density distributions at particular locations. We explore requirements and methods computation of beam position and size from profile data. Typically these data require subjective, human, processing to extract meaningful results, which is inefficient and labor intensive. Our goal is to automate such computations, or at least streamline the process.",

author = "Allen, {C. K.} and W. Blokland and Cousineau, {S. M.} and Galambos, {J. D.}",

year = "2008",

language = "English",

pages = "479--481",

note = "42nd ICFA Advanced Beam Dynamics Workshop on High-Intensity, High-Brightness Hadron Beams, HB 2008 ; Conference date: 25-08-2008 Through 29-08-2008",

}

Extracting information content within noisy, sampled profile data from charged particle beams. / Allen, C. K.; Blokland, W.; Cousineau, S. M. et al.
2008. 479-481 Paper presented at 42nd ICFA Advanced Beam Dynamics Workshop on High-Intensity, High-Brightness Hadron Beams, HB 2008, Nashville, TN, United States.

Research output: Contribution to conference › Paper › peer-review

TY - CONF

T1 - Extracting information content within noisy, sampled profile data from charged particle beams

AU - Allen, C. K.

AU - Blokland, W.

AU - Cousineau, S. M.

AU - Galambos, J. D.

PY - 2008

Y1 - 2008

N2 - Profile diagnostic devices for Charged-particle beams diagnostic provide data sets describing the one-dimensional density distributions at particular locations. We explore requirements and methods computation of beam position and size from profile data. Typically these data require subjective, human, processing to extract meaningful results, which is inefficient and labor intensive. Our goal is to automate such computations, or at least streamline the process.

AB - Profile diagnostic devices for Charged-particle beams diagnostic provide data sets describing the one-dimensional density distributions at particular locations. We explore requirements and methods computation of beam position and size from profile data. Typically these data require subjective, human, processing to extract meaningful results, which is inefficient and labor intensive. Our goal is to automate such computations, or at least streamline the process.

UR - http://www.scopus.com/inward/record.url?scp=84884389445&partnerID=8YFLogxK

M3 - Paper

AN - SCOPUS:84884389445

SP - 479

EP - 481

T2 - 42nd ICFA Advanced Beam Dynamics Workshop on High-Intensity, High-Brightness Hadron Beams, HB 2008

Y2 - 25 August 2008 through 29 August 2008

ER -

Extracting information content within noisy, sampled profile data from charged particle beams

Abstract

Conference

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