Extended photoemission fine structure analysis of the Si(111)-(7×7) surface core levels

J. A. Carlisle; M. T. Sieger; T. Miller; T. C. Chiang

doi:10.1103/PhysRevLett.71.2955

Extended photoemission fine structure analysis of the Si(111)-(7×7) surface core levels

J. A. Carlisle, M. T. Sieger, T. Miller, T. C. Chiang

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38 Scopus citations

Abstract

The surface- and bulk-derived components of the Si 2p core levels, acquired by photoemission from Si(111)-(7×7), show strong and different oscillations caused by extended fine structure above the 2p edge. An analysis of these oscillations yields the bulk and surface bond lengths which agree well with the known structure. The heretofore controversial issues of the photoemission escape depth and the atomic origin of the surface core levels are resolved.

Original language	English
Pages (from-to)	2955-2958
Number of pages	4
Journal	Physical Review Letters
Volume	71
Issue number	18
DOIs	https://doi.org/10.1103/PhysRevLett.71.2955
State	Published - 1993
Externally published	Yes

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title = "Extended photoemission fine structure analysis of the Si(111)-(7×7) surface core levels",

abstract = "The surface- and bulk-derived components of the Si 2p core levels, acquired by photoemission from Si(111)-(7×7), show strong and different oscillations caused by extended fine structure above the 2p edge. An analysis of these oscillations yields the bulk and surface bond lengths which agree well with the known structure. The heretofore controversial issues of the photoemission escape depth and the atomic origin of the surface core levels are resolved.",

author = "Carlisle, {J. A.} and Sieger, {M. T.} and T. Miller and Chiang, {T. C.}",

year = "1993",

doi = "10.1103/PhysRevLett.71.2955",

language = "English",

volume = "71",

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journal = "Physical Review Letters",

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AU - Carlisle, J. A.

AU - Sieger, M. T.

AU - Miller, T.

AU - Chiang, T. C.

PY - 1993

Y1 - 1993

N2 - The surface- and bulk-derived components of the Si 2p core levels, acquired by photoemission from Si(111)-(7×7), show strong and different oscillations caused by extended fine structure above the 2p edge. An analysis of these oscillations yields the bulk and surface bond lengths which agree well with the known structure. The heretofore controversial issues of the photoemission escape depth and the atomic origin of the surface core levels are resolved.

AB - The surface- and bulk-derived components of the Si 2p core levels, acquired by photoemission from Si(111)-(7×7), show strong and different oscillations caused by extended fine structure above the 2p edge. An analysis of these oscillations yields the bulk and surface bond lengths which agree well with the known structure. The heretofore controversial issues of the photoemission escape depth and the atomic origin of the surface core levels are resolved.

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U2 - 10.1103/PhysRevLett.71.2955

DO - 10.1103/PhysRevLett.71.2955

M3 - Article

AN - SCOPUS:3342938668

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VL - 71

SP - 2955

EP - 2958

JO - Physical Review Letters

JF - Physical Review Letters

IS - 18

ER -

Extended photoemission fine structure analysis of the Si(111)-(7×7) surface core levels

Abstract

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