Abstract
The capability with the Extended Fourier Transform (EFT) to change the initial sampling rate of a recorded or simulated image to another (final) sampling rate is discussed. One of the time consuming problems in high resolution electron microscopy is to fit simulated images with the experimental image. If the simulated images show the same sampling rate as the experimental image and are oriented in the same way, it should be possible to automate the procedure of finding the best fit between the experimental image and the simulated images. The use of EFT in one dimension to adapt the sampling rates between the experiment and the simulation is shown.
Original language | English |
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Pages | 918-919 |
Number of pages | 2 |
State | Published - 1994 |
Event | Proceedings of the 52nd Annual Meeting of the Microscopy Society of America - New Orleans, LA, USA Duration: Jul 31 1994 → Aug 5 1994 |
Conference
Conference | Proceedings of the 52nd Annual Meeting of the Microscopy Society of America |
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City | New Orleans, LA, USA |
Period | 07/31/94 → 08/5/94 |