Exploring the air stability of PdSe2 via electrical transport measurements and defect calculations

Anna N. Hoffman, Yiyi Gu, Liangbo Liang, Jason D. Fowlkes, Kai Xiao, Philip D. Rack

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Abstract

In this work we investigate the effects of ambient exposure on CVD grown PdSe2 and correlate density functional theory calculations of various physisorption and chemisorption binding energies and band structures to the observed changes in the electrical transport. Pristine PdSe2 is n-type due to intrinsic selenium vacancies, but shows increased p-type conduction and decreased n-type conduction as a function of ambient aging during which various aging mechanisms appear to be operative. Short term aging (<160 h) is ascribed to an activated chemisorption of molecular O2 at selenium vacancies; first-principles calculations suggest a ~0.85 eV activation energy and adsorption geometries with binding energies varying between 1.3–1.6 eV, in agreement with experimental results. Importantly, this chemisorption is reversible with a low temperature anneal. At long term aging (>430 h), there is a total suppression of n-type conduction, which is attributed to a dissociative adsorption/reaction of the O2 molecules to atomic O and subsequent PdO2 formation. XPS confirms the presence of PdO2 in long term aged flakes. At these extended aging times, the low temperature anneal restores low n-type conduction and suppresses p-type conduction due to the low thermal stability of PdO2 which, in agreement with XPS measurements, sublimates during the anneal. Thus PdSe2 devices can be processed into device architectures in standard laboratory environments if atmospheric exposure times are limited to on the order of 1 week.

Original languageEnglish
Article number50
Journalnpj 2D Materials and Applications
Volume3
Issue number1
DOIs
StatePublished - Dec 1 2019

Funding

P.D.R., A.N.H., J.D.F and L.L. acknowledge support from the US Department of Energy (DOE) under grant number KC 0403040 ERKCZ01. A.N.H. also acknowledges support from the Center for Materials Processing. Y.G. and K.X. acknowledge support by the U.S. Department of Energy, Office of Science, Basic Energy Sciences, Materials Sciences and Engineering Division. Material growth, device synthesis, DFT calculations, and characterization measurements were conducted at the Center for Nanophase Materials Sciences, which is a DOE Office of Science User Facility. P.D.R. and A.N.H. would like to acknowledge Jonathan Woodward and Harry Meyer for help acquiring the XPS data.

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