Exploratory search for improved oxidizing agents used in the reduction of surface leakage currents of CdZnTe detectors

G. W. Wright, D. A. Chinn, B. A. Brunnett, Mark A. Mescher, J. Lund, R. Olsen, F. P. Doty, T. E. Schlesienger, R. B. James, K. Chattopadyhay, R. Wingfield, A. Burger

Research output: Contribution to journalConference articlepeer-review

14 Scopus citations

Abstract

We have studied the ability of different oxidizing agents, other than H2O2 to reduce the surface leakage current of CdZnTe devices. All chemical treatments were performed in aqueous solutions, at room temperature, with weight percent concentrations of 2.5 g/25 ml. Before and after I-V curves were obtained. It was found that by increasing the basicity of the chemical treatment, greater reduction in surface leakage current occurred. The results show that these alternative chemical treatments reduced the surface leakage current as well as or better than H2O2 chemical treatment.

Original languageEnglish
Pages (from-to)481-485
Number of pages5
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume3768
DOIs
StatePublished - 1999
Externally publishedYes
EventProceedings of the 1999 Hard X-Ray, Gamma-Ray, and Neutron Detector Physics - Denver, CO, USA
Duration: Jul 19 1999Jul 23 1999

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