Abstract
The instability of hybrid organic–inorganic perovskite (HOIP) devices is one of the significant challenges preventing commercialization. Exploring these phenomena is severely limited by the complexity of the intrinsic electrochemistry of HOIPs, the presence of multiple volatile and mobile ionic species, and the possible role of environmentally induced reactions at surfaces and triple-phase junctions. Here, in situ studies of the electrochemistry of methylammonium lead bromide perovskite with the Au electrode interface are reported via light- and voltage-dependent time-of-flight secondary ion mass spectrometry (ToF-SIMS) imaging of lateral perovskite heterostructures. While ToF-SIMS allows for the visualization of the chemical composition along the surface and its evolution with light and electrical bias, the interpretation of the multidimensional data obtained is often limited due to strong correlations between chemical signatures and the need to track multiple peaks at once. Here, a machine learning workflow combining the Hough transform and non-negative matrix factorization and non-negative tensor decomposition is developed to avoid this limitation and extract salient features of associated chemical changes and to separate the light- and voltage-dependent dynamics. Combining these in situ characterizations and the machine learning workflow provides comprehensive information on the chemical nature of moving species, ion accumulation, and interfacial electrochemical reactions in HOIP devices.
Original language | English |
---|---|
Article number | 2001995 |
Journal | Advanced Functional Materials |
Volume | 30 |
Issue number | 36 |
DOIs | |
State | Published - Sep 1 2020 |
Funding
This material was based upon work supported by the U.S. Department of Homeland Security under Grant Award Number 16DNARI00018‐04‐0. K.H. acknowledges partial support from the Center for Materials Processing, a Center of Excellence at the University of Tennessee, Knoxville funded by the Tennessee Higher Education Commission (THEC). Time‐of‐flight secondary ion mass spectrometry (M.L., A.V.I., and O.S.O.) and data analysis workflow (R.K.V., M.Z., and S.V.K.) were conducted at the Center for Nanophase Materials Sciences, which is a DOE Office of Science User Facility, using instrumentation within ORNL’s Materials Characterization Core provided by UT‐Battelle, LLC under Contract No. DE‐AC05‐00OR22725 with the U.S. Department of Energy. This material was based upon work supported by the U.S. Department of Homeland Security under Grant Award Number 16DNARI00018-04-0. K.H. acknowledges partial support from the Center for Materials Processing, a Center of Excellence at the University of Tennessee, Knoxville funded by the Tennessee Higher Education Commission (THEC). Time-of-flight secondary ion mass spectrometry (M.L., A.V.I., and O.S.O.) and data analysis workflow (R.K.V., M.Z., and S.V.K.) were conducted at the Center for Nanophase Materials Sciences, which is a DOE Office of Science User Facility, using instrumentation within ORNL?s Materials Characterization Core provided by UT-Battelle, LLC under Contract No. DE-AC05-00OR22725 with the U.S. Department of Energy.
Funders | Funder number |
---|---|
DOE Office of Science | |
Tennessee Higher Education Commission | |
UT-Battelle, LLC | DE-AC05-00OR22725 |
U.S. Department of Energy | |
U.S. Department of Homeland Security | 16DNARI00018‐04‐0 |
Office of Science | |
University of Tennessee | |
Tennessee Higher Education Commission |
Keywords
- MAPbBr
- ToF-SIMS
- electrochemical reaction
- ion migration
- machine learning
- perovskite