Exploration of complex multilayer film growth morphologies: STM analysis and predictive atomistic modeling for Ag on Ag(111)

Maozhi Li, P. W. Chung, E. Cox, C. J. Jenks, P. A. Thiel, J. W. Evans

Research output: Contribution to journalArticlepeer-review

26 Scopus citations

Abstract

Scanning tunneling microscopy studies are integrated with development of a realistic atomistic model to both characterize and elucidate the complex mounded morphologies formed by deposition of Ag on Ag(111) at 150 and 180 K. Threefold symmetric lateral shapes of islands and mounds are shown to reflect the influence of a nonuniform step edge barrier inhibiting interlayer transport. Modeling of structure at the mound peaks leads to a sensitive estimate of the magnitude of this large barrier.

Original languageEnglish
Article number033402
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume77
Issue number3
DOIs
StatePublished - Jan 3 2008
Externally publishedYes

Fingerprint

Dive into the research topics of 'Exploration of complex multilayer film growth morphologies: STM analysis and predictive atomistic modeling for Ag on Ag(111)'. Together they form a unique fingerprint.

Cite this