TY - JOUR
T1 - Explainable AI-infused ultrasonic inspection for internal defect detection
AU - Karthikeyan, Adithyaa
AU - Tiwari, Akash
AU - Zhong, Yuhao
AU - Bukkapatnam, Satish T.S.
N1 - Publisher Copyright:
© 2022 CIRP
PY - 2022/1
Y1 - 2022/1
N2 - While AI and imaging technologies are dramatically transforming the process and machine condition monitoring, product inspection remains confined to probing the geometry and surface morphology. Subsurface and bulk inspection remain prohibitively slow and imprecise. This paper presents an explainable AI (XAI)-infused ultrasound imaging approach for rapid detection of artifacts including product defects. The approach led to the discovery of correlated spatial patterns in the images located away from the artifacts. This discovery enabled accurate (> 80%) detection of artifacts that are not discernible with the current image segmentation methods, and it could profoundly impact product quality and (cyber)security assurance technologies.
AB - While AI and imaging technologies are dramatically transforming the process and machine condition monitoring, product inspection remains confined to probing the geometry and surface morphology. Subsurface and bulk inspection remain prohibitively slow and imprecise. This paper presents an explainable AI (XAI)-infused ultrasound imaging approach for rapid detection of artifacts including product defects. The approach led to the discovery of correlated spatial patterns in the images located away from the artifacts. This discovery enabled accurate (> 80%) detection of artifacts that are not discernible with the current image segmentation methods, and it could profoundly impact product quality and (cyber)security assurance technologies.
KW - Artificial intelligence
KW - Inspection
KW - Quality assurance
KW - Ultrasonic
UR - http://www.scopus.com/inward/record.url?scp=85130458063&partnerID=8YFLogxK
U2 - 10.1016/j.cirp.2022.04.036
DO - 10.1016/j.cirp.2022.04.036
M3 - Article
AN - SCOPUS:85130458063
SN - 0007-8506
VL - 71
SP - 449
EP - 452
JO - CIRP Annals - Manufacturing Technology
JF - CIRP Annals - Manufacturing Technology
IS - 1
ER -