Experimental station for multiscale surface structural analyses of soft-material films at SPring-8 via a GISWAX/GIXD/XR-integrated system

Hiroki Ogawa; Hiroyasu Masunaga; Sono Sasaki; Shunji Goto; Takashi Tanaka; Takamitsu Seike; Sunao Takahashi; Kunikazu Takeshita; Nobuteru Nariyama; Haruhiko Ohashi; Toru Ohata; Yukito Furukawa; Tomohiro Matsushita; Yasuhide Ishizawa; Naoto Yagi; Masaki Takata; Hideo Kitamura; Atsushi Takahara; Kazuo Sakurai; Kohji Tashiro; Toshiji Kanaya; Yoshiyuki Amemiya; Kazuyuki Horie; Mikihito Takenaka; Hiroshi Jinnai; Hiroshi Okuda; Isamu Akiba; Isao Takahashi; Katsuhiro Yamamoto; Masamichi Hikosaka; Shinichi Sakurai; Yuya Shinohara; Yasunori Sugihara; Akihiko Okada

doi:10.1038/pj.2012.194

Experimental station for multiscale surface structural analyses of soft-material films at SPring-8 via a GISWAX/GIXD/XR-integrated system

Hiroki Ogawa
, Hiroyasu Masunaga
, Sono Sasaki
, Shunji Goto
, Takashi Tanaka
, Takamitsu Seike
, Sunao Takahashi
, Kunikazu Takeshita
, Nobuteru Nariyama
, Haruhiko Ohashi
, Toru Ohata
, Yukito Furukawa
, Tomohiro Matsushita
, Yasuhide Ishizawa
, Naoto Yagi
, Masaki Takata
, Hideo Kitamura
, Atsushi Takahara
, Kazuo Sakurai
, Kohji Tashiro

Toshiji Kanaya, Yoshiyuki Amemiya, Kazuyuki Horie, Mikihito Takenaka, Hiroshi Jinnai, Hiroshi Okuda, Isamu Akiba, Isao Takahashi, Katsuhiro Yamamoto, Masamichi Hikosaka, Shinichi Sakurai, Yuya Shinohara, Yasunori Sugihara, Akihiko Okada

Research output: Contribution to journal › Article › peer-review

57 Scopus citations

Abstract

To gain a better understanding of the function of soft-material thin films, one should investigate the multiscale structural information from the surface roughness down to the atomically truncated structures at microarea. To achieve such an integrated investigation, a new experimental system has been launched by coupling with the measurement techniques, which include grazing incidence small/wide-angle X-ray scattering (GISWAXS) and grazing incidence X-ray diffraction (GIXD), as well as X-ray reflectivity (XR), at the BL03XU beamline of SPring-8. The high brilliance and low divergence beam allows the surface and interface structure measurements from the angstrom to the micrometer scale using a soller-slit system for proper optimization of measurement precision. A typical structural analysis of the soft-material film was performed to evaluate the practical performance and specifications of the experimental system.

Original language	English
Pages (from-to)	109-116
Number of pages	8
Journal	Polymer Journal
Volume	45
Issue number	1
DOIs	https://doi.org/10.1038/pj.2012.194
State	Published - Jan 2013
Externally published	Yes

Keywords

FSBL
SPring-8
X-ray reflectivity
grazing incidence X-ray diffraction
grazing incidence small/wide-angle X-ray scattering
polymer thin films

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10.1038/pj.2012.194

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Ogawa, H., Masunaga, H., Sasaki, S., Goto, S., Tanaka, T., Seike, T., Takahashi, S., Takeshita, K., Nariyama, N., Ohashi, H., Ohata, T., Furukawa, Y., Matsushita, T., Ishizawa, Y., Yagi, N., Takata, M., Kitamura, H., Takahara, A., Sakurai, K., ... Okada, A. (2013). Experimental station for multiscale surface structural analyses of soft-material films at SPring-8 via a GISWAX/GIXD/XR-integrated system. Polymer Journal, 45(1), 109-116. https://doi.org/10.1038/pj.2012.194

@article{4ddcf8399c1e48fd9c3438fb7c050178,

title = "Experimental station for multiscale surface structural analyses of soft-material films at SPring-8 via a GISWAX/GIXD/XR-integrated system",

abstract = "To gain a better understanding of the function of soft-material thin films, one should investigate the multiscale structural information from the surface roughness down to the atomically truncated structures at microarea. To achieve such an integrated investigation, a new experimental system has been launched by coupling with the measurement techniques, which include grazing incidence small/wide-angle X-ray scattering (GISWAXS) and grazing incidence X-ray diffraction (GIXD), as well as X-ray reflectivity (XR), at the BL03XU beamline of SPring-8. The high brilliance and low divergence beam allows the surface and interface structure measurements from the angstrom to the micrometer scale using a soller-slit system for proper optimization of measurement precision. A typical structural analysis of the soft-material film was performed to evaluate the practical performance and specifications of the experimental system.",

keywords = "FSBL, SPring-8, X-ray reflectivity, grazing incidence X-ray diffraction, grazing incidence small/wide-angle X-ray scattering, polymer thin films",

author = "Hiroki Ogawa and Hiroyasu Masunaga and Sono Sasaki and Shunji Goto and Takashi Tanaka and Takamitsu Seike and Sunao Takahashi and Kunikazu Takeshita and Nobuteru Nariyama and Haruhiko Ohashi and Toru Ohata and Yukito Furukawa and Tomohiro Matsushita and Yasuhide Ishizawa and Naoto Yagi and Masaki Takata and Hideo Kitamura and Atsushi Takahara and Kazuo Sakurai and Kohji Tashiro and Toshiji Kanaya and Yoshiyuki Amemiya and Kazuyuki Horie and Mikihito Takenaka and Hiroshi Jinnai and Hiroshi Okuda and Isamu Akiba and Isao Takahashi and Katsuhiro Yamamoto and Masamichi Hikosaka and Shinichi Sakurai and Yuya Shinohara and Yasunori Sugihara and Akihiko Okada",

year = "2013",

month = jan,

doi = "10.1038/pj.2012.194",

language = "English",

volume = "45",

pages = "109--116",

journal = "Polymer Journal",

issn = "0032-3896",

publisher = "Springer Nature [academic journals on nature.com]",

number = "1",

}

Ogawa, H, Masunaga, H, Sasaki, S, Goto, S, Tanaka, T, Seike, T, Takahashi, S, Takeshita, K, Nariyama, N, Ohashi, H, Ohata, T, Furukawa, Y, Matsushita, T, Ishizawa, Y, Yagi, N, Takata, M, Kitamura, H, Takahara, A, Sakurai, K, Tashiro, K, Kanaya, T, Amemiya, Y, Horie, K, Takenaka, M, Jinnai, H, Okuda, H, Akiba, I, Takahashi, I, Yamamoto, K, Hikosaka, M, Sakurai, S, Shinohara, Y, Sugihara, Y & Okada, A 2013, 'Experimental station for multiscale surface structural analyses of soft-material films at SPring-8 via a GISWAX/GIXD/XR-integrated system', Polymer Journal, vol. 45, no. 1, pp. 109-116. https://doi.org/10.1038/pj.2012.194

TY - JOUR

T1 - Experimental station for multiscale surface structural analyses of soft-material films at SPring-8 via a GISWAX/GIXD/XR-integrated system

AU - Ogawa, Hiroki

AU - Masunaga, Hiroyasu

AU - Sasaki, Sono

AU - Goto, Shunji

AU - Tanaka, Takashi

AU - Seike, Takamitsu

AU - Takahashi, Sunao

AU - Takeshita, Kunikazu

AU - Nariyama, Nobuteru

AU - Ohashi, Haruhiko

AU - Ohata, Toru

AU - Furukawa, Yukito

AU - Matsushita, Tomohiro

AU - Ishizawa, Yasuhide

AU - Yagi, Naoto

AU - Takata, Masaki

AU - Kitamura, Hideo

AU - Takahara, Atsushi

AU - Sakurai, Kazuo

AU - Tashiro, Kohji

AU - Kanaya, Toshiji

AU - Amemiya, Yoshiyuki

AU - Horie, Kazuyuki

AU - Takenaka, Mikihito

AU - Jinnai, Hiroshi

AU - Okuda, Hiroshi

AU - Akiba, Isamu

AU - Takahashi, Isao

AU - Yamamoto, Katsuhiro

AU - Hikosaka, Masamichi

AU - Sakurai, Shinichi

AU - Shinohara, Yuya

AU - Sugihara, Yasunori

AU - Okada, Akihiko

PY - 2013/1

Y1 - 2013/1

N2 - To gain a better understanding of the function of soft-material thin films, one should investigate the multiscale structural information from the surface roughness down to the atomically truncated structures at microarea. To achieve such an integrated investigation, a new experimental system has been launched by coupling with the measurement techniques, which include grazing incidence small/wide-angle X-ray scattering (GISWAXS) and grazing incidence X-ray diffraction (GIXD), as well as X-ray reflectivity (XR), at the BL03XU beamline of SPring-8. The high brilliance and low divergence beam allows the surface and interface structure measurements from the angstrom to the micrometer scale using a soller-slit system for proper optimization of measurement precision. A typical structural analysis of the soft-material film was performed to evaluate the practical performance and specifications of the experimental system.

AB - To gain a better understanding of the function of soft-material thin films, one should investigate the multiscale structural information from the surface roughness down to the atomically truncated structures at microarea. To achieve such an integrated investigation, a new experimental system has been launched by coupling with the measurement techniques, which include grazing incidence small/wide-angle X-ray scattering (GISWAXS) and grazing incidence X-ray diffraction (GIXD), as well as X-ray reflectivity (XR), at the BL03XU beamline of SPring-8. The high brilliance and low divergence beam allows the surface and interface structure measurements from the angstrom to the micrometer scale using a soller-slit system for proper optimization of measurement precision. A typical structural analysis of the soft-material film was performed to evaluate the practical performance and specifications of the experimental system.

KW - FSBL

KW - SPring-8

KW - X-ray reflectivity

KW - grazing incidence X-ray diffraction

KW - grazing incidence small/wide-angle X-ray scattering

KW - polymer thin films

UR - https://www.scopus.com/pages/publications/84872200891

U2 - 10.1038/pj.2012.194

DO - 10.1038/pj.2012.194

M3 - Article

AN - SCOPUS:84872200891

SN - 0032-3896

VL - 45

SP - 109

EP - 116

JO - Polymer Journal

JF - Polymer Journal

IS - 1

ER -

Experimental station for multiscale surface structural analyses of soft-material films at SPring-8 via a GISWAX/GIXD/XR-integrated system

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Keywords

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