Experimental challenges in using a 1.2 kV GaN HEMT for high power density converters

Fahmid Sadeque, Amin Yousefzadeh Fard, Aswad Adib, Mohammad B. Shadmand, Behrooz Mirafza

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

3 Scopus citations

Abstract

Recent success in the fabrication of 1.2 kV high-performance GaN HEMTs has made this technology an interesting alternative for high power applications. In this paper, for the first time, the newly available 1200V/15A GaN HEMTs is experimentally studied. The switching behavior of the device is investigated precisely to provide a better perspective on this family of switches. A test converter circuit is built with the GaN HEMT devices, which has been tested under different voltages and frequencies. Various challenges faced throughout the designing and testing stages are identified and reported in this paper for further investigations in the future.

Original languageEnglish
Title of host publication2019 IEEE Texas Power and Energy Conference, TPEC 2019
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781538692844
DOIs
StatePublished - Mar 6 2019
Externally publishedYes
Event2019 IEEE Texas Power and Energy Conference, TPEC 2019 - College Station, United States
Duration: Feb 7 2019Feb 8 2019

Publication series

Name2019 IEEE Texas Power and Energy Conference, TPEC 2019

Conference

Conference2019 IEEE Texas Power and Energy Conference, TPEC 2019
Country/TerritoryUnited States
CityCollege Station
Period02/7/1902/8/19

Keywords

  • Gallium Nitride
  • HEMT
  • High Power Density Converters
  • High Voltage Semiconductors
  • Wide Bandgap Semiconductors

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