EXAFS studies of nanocrystals of Zn1-xMnxO: A dilute magnetic semiconductor oxide system

  • S. Chattopadhyay
  • , S. D. Kelly
  • , T. Shibata
  • , R. Viswanatha
  • , M. Balasubramanian
  • , S. Stoupin
  • , C. U. Segre
  • , D. D. Sarma

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

5 Scopus citations

Abstract

Zn edge and Mn edge EXAFS studies have been performed on bulk and nanocrystals (4.7 nm) of the dilute magnetic semiconductor Zn 1-xMnxO, with x varying from 0.05 to 0.5. Preliminary analysis and linear combination fitting shows that Mn replaces Zn in the bulk sample, whereas in the nanocrystal samples, with different amounts of Mn, only a very small percentage of the Mn atoms replace Zn. The majority of the Mn atoms remain on the surface of the nanocrystallites in the form of Mn oxides.

Original languageEnglish
Title of host publicationX-RAY ABSORPTION FINE STRUCTURE - XAFS13
Subtitle of host publication13th International Conference
Pages809-811
Number of pages3
DOIs
StatePublished - 2007
Externally publishedYes
EventX-RAY ABSORPTION FINE STRUCTURE - XAFS13: 13th International Conference - Stanford, CA, United States
Duration: Jul 9 2006Jul 14 2006

Publication series

NameAIP Conference Proceedings
Volume882
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616

Conference

ConferenceX-RAY ABSORPTION FINE STRUCTURE - XAFS13: 13th International Conference
Country/TerritoryUnited States
CityStanford, CA
Period07/9/0607/14/06

Keywords

  • DMS
  • EXAFS
  • Nanocrystals
  • Nanoparticles
  • ZnO

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