Abstract
Silicon carbide (SiC) is a primary candidate for passive irradiation temperature monitoring, and continuous dilatometry (CD) has been proposed as the key method for extracting irradiation temperatures from SiC thermometry samples. The CD method was evaluated to determine the sensitivity of the technique to the analysis procedure, as well as its accuracy and precision. Analysis found that the CD method had a ±20 °C sensitivity to the algorithm used to determine the irradiation temperatures. Comparison of the CD method with the continuous length change method for SiC thermometry showed CD is a more viable method of extracting irradiation temperatures. A comparison of irradiation temperatures determined by CD with those from active thermocouple measurements further validated the CD method for accurately and precisely determining irradiation temperatures in materials test reactor irradiations.
Original language | English |
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Pages (from-to) | 46-56 |
Number of pages | 11 |
Journal | Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms |
Volume | 445 |
DOIs | |
State | Published - Apr 15 2019 |
Funding
Research performed within was completed at the Oak Ridge National Laboratory (ORNL) and sponsored by the U.S. Department of Energy Office of Fusion Energy Sciences, the National Institute of Natural Sciences (NINS) under the DOE agreement: NFE-13-04478 and the Japan Atomic Energy Agency ( JAEA ) under the DOE agreement: NFE-10-02779. Oak Ridge National Laboratory is managed by UT-Battelle, LLC under Contract No. DE-AC05-00OR22725 for the U.S. Department of Energy. The authors would like to thank T. Koyanagi and L. M. Garrison for supplying additional data to the SiC thermometry database, D. Counce for the exhaustive editing completed on the manuscript, and A. A. Campbell and A. Selby for providing the R source code for the beta and Version 1 Campbell algorithms. The source code was modified for scripting and further optimized by the authors of this work for rapid data analysis.
Keywords
- Annealing
- Dilatometry
- Passive irradiation temperature monitor
- Silicon carbide (SiC)