Evaluation of NH4F/H2O2 effectiveness as a surface passivation agent for Cd1-xZnxTe crystals

G. W. Wright; R. B. James; D. Chinn; B. A. Brunett; R. W. Olsen; J. van Scyoc; M. Clift; A. Burger; K. Chattopadhyay; D. Shi; R. Wingfield

doi:10.1117/12.407594

Evaluation of NH₄F/H₂O₂ effectiveness as a surface passivation agent for Cd_1-xZn_xTe crystals

G. W. Wright, R. B. James, D. Chinn, B. A. Brunett, R. W. Olsen, J. van Scyoc, M. Clift, A. Burger, K. Chattopadhyay, D. Shi, R. Wingfield

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40 Scopus citations

Abstract

Various passivating agents that reduced the surface leakage current of CZT crystals have been previously reported. In one of the studies, NH₄F/H₂O₂ was identified as a promising passivation agent for CZT. We now present a study that includes the effect of NH₄F/H₂O₂ treatment on the surface properties and detector performance. An elemental depth profile was obtained via Auger Electron Spectroscopy. Furthermore, X-ray Photoelectron Spectroscopy acquired at different processing times to identify the chemical states of the elemental species that composed the dielectric layer. It was found that the NH₄F/H₂O₂ surface passivation significantly improved the sensitivity and energy resolution of CZT detectors. Furthermore, the NH₄F/H₂O₂ treatment did not attack the Au electrodes, which eliminated the need to protect the contacts in the detector fabrication process.

Original language	English
Pages (from-to)	324-335
Number of pages	12
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	4141
Issue number	1
DOIs	https://doi.org/10.1117/12.407594
State	Published - Nov 21 2000
Externally published	Yes

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Wright, G. W., James, R. B., Chinn, D., Brunett, B. A., Olsen, R. W., van Scyoc, J., Clift, M., Burger, A., Chattopadhyay, K., Shi, D., & Wingfield, R. (2000). Evaluation of NH₄F/H₂O₂ effectiveness as a surface passivation agent for Cd_1-xZn_xTe crystals. Proceedings of SPIE - The International Society for Optical Engineering, 4141(1), 324-335. https://doi.org/10.1117/12.407594

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title = "Evaluation of NH4F/H2O2 effectiveness as a surface passivation agent for Cd1-xZnxTe crystals",

abstract = "Various passivating agents that reduced the surface leakage current of CZT crystals have been previously reported. In one of the studies, NH4F/H2O2 was identified as a promising passivation agent for CZT. We now present a study that includes the effect of NH4F/H2O2 treatment on the surface properties and detector performance. An elemental depth profile was obtained via Auger Electron Spectroscopy. Furthermore, X-ray Photoelectron Spectroscopy acquired at different processing times to identify the chemical states of the elemental species that composed the dielectric layer. It was found that the NH4F/H2O2 surface passivation significantly improved the sensitivity and energy resolution of CZT detectors. Furthermore, the NH4F/H2O2 treatment did not attack the Au electrodes, which eliminated the need to protect the contacts in the detector fabrication process.",

author = "Wright, {G. W.} and James, {R. B.} and D. Chinn and Brunett, {B. A.} and Olsen, {R. W.} and {van Scyoc}, J. and M. Clift and A. Burger and K. Chattopadhyay and D. Shi and R. Wingfield",

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Wright, GW, James, RB, Chinn, D, Brunett, BA, Olsen, RW, van Scyoc, J, Clift, M, Burger, A, Chattopadhyay, K, Shi, D & Wingfield, R 2000, 'Evaluation of NH₄F/H₂O₂ effectiveness as a surface passivation agent for Cd_1-xZn_xTe crystals', Proceedings of SPIE - The International Society for Optical Engineering, vol. 4141, no. 1, pp. 324-335. https://doi.org/10.1117/12.407594

TY - JOUR

T1 - Evaluation of NH4F/H2O2 effectiveness as a surface passivation agent for Cd1-xZnxTe crystals

AU - Wright, G. W.

AU - James, R. B.

AU - Chinn, D.

AU - Brunett, B. A.

AU - Olsen, R. W.

AU - van Scyoc, J.

AU - Clift, M.

AU - Burger, A.

AU - Chattopadhyay, K.

AU - Shi, D.

AU - Wingfield, R.

PY - 2000/11/21

Y1 - 2000/11/21

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AB - Various passivating agents that reduced the surface leakage current of CZT crystals have been previously reported. In one of the studies, NH4F/H2O2 was identified as a promising passivation agent for CZT. We now present a study that includes the effect of NH4F/H2O2 treatment on the surface properties and detector performance. An elemental depth profile was obtained via Auger Electron Spectroscopy. Furthermore, X-ray Photoelectron Spectroscopy acquired at different processing times to identify the chemical states of the elemental species that composed the dielectric layer. It was found that the NH4F/H2O2 surface passivation significantly improved the sensitivity and energy resolution of CZT detectors. Furthermore, the NH4F/H2O2 treatment did not attack the Au electrodes, which eliminated the need to protect the contacts in the detector fabrication process.

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Evaluation of NH₄F/H₂O₂ effectiveness as a surface passivation agent for Cd_1-xZn_xTe crystals

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