Evaluation of matrix and interface properties in SiC/SiC composites

A. D. Surrett, K. L. More, R. A. Lowden

Research output: Contribution to journalConference articlepeer-review

Abstract

The article presents the microstructural and mechanical properties of SiC/SiC composite matrix characterized as function of the processing temperature. Several microscopical techniques, such as AFM, SEM and TEM were used to characterize the matrix. The Vickers hardness numbers (VHN) were measured and compared in different temperatures. Results showed differences in the microstructural evolution of the SiC matrix during processing as well as grain orientation which are reflected in the diffraction patterns.

Original languageEnglish
Pages (from-to)922-923
Number of pages2
JournalProceedings - Annual Meeting, Microscopy Society of America
StatePublished - 1993
EventProceedings of the 51st Annual Meeting Microscopy Society of America - Cincinnati, OH, USA
Duration: Aug 1 1993Aug 6 1993

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