Abstract
A combination of 300 keV 84Kr ion implantation and Time-of-Flight Elastic Recoil Detection Analysis is utilised to investigate the diffusion of Kr in UO2 and ADOPTTM fuels. Composition depth-profiles on the nanometer scale were obtained, both for as-implanted samples and after annealing at 800°C for 1 h. Observed drifts in the 84Kr profiles could be associated with short-range diffusion mechanisms. The approach employed here provides the possibility to make direct comparisons with atomistic scale modelling data, and can be of service as a separate effect test in line with the Accelerated Fuel Qualification initiative.
| Original language | English |
|---|---|
| Pages (from-to) | 243-249 |
| Number of pages | 7 |
| Journal | Journal of Nuclear Science and Technology |
| Volume | 62 |
| Issue number | 3 |
| DOIs | |
| State | Published - 2025 |
| Externally published | Yes |
Funding
This work was supported by the Vetenskapsrådet [VR-RFI-2019-00191]. Financial support from Studsvik Nuclear AB within the framework of the ANItA Centre is gratefully acknowledged, as is the financial support from The Swedish Strategic Research Foundation (SSF) within the SUNRISE-project and the financial support from the Swedish Research Council (VR-RFI) under contract number 2019-00191. Financial support from Studsvik Nuclear AB within the framework of the ANItA Centre is gratefully acknowledged, as is the financial support from The Swedish Strategic Research Foundation (SSF) within the SUNRISE-project and the financial support from the Swedish Research Council (VR-RFI) under contract number 2019-00191.
Keywords
- ADOPT
- Kr implantation
- ToF-ERDA
- UO
- elemental depth-profiling