Erratum: Simulation, modeling, and crystal growth of Cd 0.9Zn 0.1Te for nuclear spectrometers (Journal of Electronic Materials (2006) 35:6 (1251-1256) DOI: 10.1007/s11664-006-0250-6)

Krishna C. Mandal; Sung Hoon Kang; Michael Choi; Job Bello; Lili Zheng; Hui Zhang; Michael Groza; Utpal N. Roy; Arnold Burger; Gerald E. Jellison; David E. Holcomb; Gomez W. Wright; Joseph A. Williams

doi:10.1007/s11664-008-0450-3

Erratum: Simulation, modeling, and crystal growth of Cd _0.9Zn _0.1Te for nuclear spectrometers (Journal of Electronic Materials (2006) 35:6 (1251-1256) DOI: 10.1007/s11664-006-0250-6)

Krishna C. Mandal, Sung Hoon Kang, Michael Choi, Job Bello, Lili Zheng, Hui Zhang, Michael Groza, Utpal N. Roy, Arnold Burger, Gerald E. Jellison, David E. Holcomb, Gomez W. Wright, Joseph A. Williams

Advanced Radiation Detection, Imaging, D

Research output: Contribution to journal › Comment/debate

Original language	English
Pages (from-to)	208
Number of pages	1
Journal	Journal of Electronic Materials
Volume	38
Issue number	1
DOIs	https://doi.org/10.1007/s11664-008-0450-3
State	Published - Jan 2009

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10.1007/s11664-008-0450-3

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Mandal, K. C., Kang, S. H., Choi, M., Bello, J., Zheng, L., Zhang, H., Groza, M., Roy, U. N., Burger, A., Jellison, G. E., Holcomb, D. E., Wright, G. W., & Williams, J. A. (2009). Erratum: Simulation, modeling, and crystal growth of Cd _0.9Zn _0.1Te for nuclear spectrometers (Journal of Electronic Materials (2006) 35:6 (1251-1256) DOI: 10.1007/s11664-006-0250-6). Journal of Electronic Materials, 38(1), 208. https://doi.org/10.1007/s11664-008-0450-3

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title = "Erratum: Simulation, modeling, and crystal growth of Cd 0.9Zn 0.1Te for nuclear spectrometers (Journal of Electronic Materials (2006) 35:6 (1251-1256) DOI: 10.1007/s11664-006-0250-6)",

author = "Mandal, {Krishna C.} and Kang, {Sung Hoon} and Michael Choi and Job Bello and Lili Zheng and Hui Zhang and Michael Groza and Roy, {Utpal N.} and Arnold Burger and Jellison, {Gerald E.} and Holcomb, {David E.} and Wright, {Gomez W.} and Williams, {Joseph A.}",

year = "2009",

month = jan,

doi = "10.1007/s11664-008-0450-3",

language = "English",

volume = "38",

pages = "208",

journal = "Journal of Electronic Materials",

issn = "0361-5235",

number = "1",

}

Mandal, KC, Kang, SH, Choi, M, Bello, J, Zheng, L, Zhang, H, Groza, M, Roy, UN, Burger, A, Jellison, GE, Holcomb, DE, Wright, GW & Williams, JA 2009, 'Erratum: Simulation, modeling, and crystal growth of Cd _0.9Zn _0.1Te for nuclear spectrometers (Journal of Electronic Materials (2006) 35:6 (1251-1256) DOI: 10.1007/s11664-006-0250-6)', Journal of Electronic Materials, vol. 38, no. 1, pp. 208. https://doi.org/10.1007/s11664-008-0450-3

Erratum: Simulation, modeling, and crystal growth of Cd _0.9Zn _0.1Te for nuclear spectrometers (Journal of Electronic Materials (2006) 35:6 (1251-1256) DOI: 10.1007/s11664-006-0250-6). / Mandal, Krishna C.; Kang, Sung Hoon; Choi, Michael et al.
In: Journal of Electronic Materials, Vol. 38, No. 1, 01.2009, p. 208.

Research output: Contribution to journal › Comment/debate

TY - JOUR

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T2 - Simulation, modeling, and crystal growth of Cd 0.9Zn 0.1Te for nuclear spectrometers (Journal of Electronic Materials (2006) 35:6 (1251-1256) DOI: 10.1007/s11664-006-0250-6)

AU - Mandal, Krishna C.

AU - Kang, Sung Hoon

AU - Choi, Michael

AU - Bello, Job

AU - Zheng, Lili

AU - Zhang, Hui

AU - Groza, Michael

AU - Roy, Utpal N.

AU - Burger, Arnold

AU - Jellison, Gerald E.

AU - Holcomb, David E.

AU - Wright, Gomez W.

AU - Williams, Joseph A.

PY - 2009/1

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U2 - 10.1007/s11664-008-0450-3

DO - 10.1007/s11664-008-0450-3

M3 - Comment/debate

AN - SCOPUS:57649155758

SN - 0361-5235

VL - 38

SP - 208

JO - Journal of Electronic Materials

JF - Journal of Electronic Materials

IS - 1

ER -

Erratum: Simulation, modeling, and crystal growth of Cd 0.9Zn 0.1Te for nuclear spectrometers (Journal of Electronic Materials (2006) 35:6 (1251-1256) DOI: 10.1007/s11664-006-0250-6)

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Erratum: Simulation, modeling, and crystal growth of Cd _0.9Zn _0.1Te for nuclear spectrometers (Journal of Electronic Materials (2006) 35:6 (1251-1256) DOI: 10.1007/s11664-006-0250-6)