TY - JOUR
T1 - Erratum
T2 - First-Principles Assessment of CdTe as a Tunnel Barrier at the α-Sn/InSb Interface (ACS Applied Materials and Interfaces (2023) 15: 12 (16288−16298) DOI: 10.1021/acsami.3c00323)
AU - Jardine, Malcolm J.A.
AU - Dardzinski, Derek
AU - Yu, Maituo
AU - Purkayastha, Amrita
AU - Chen, An Hsi
AU - Chang, Yu Hao
AU - Engel, Aaron
AU - Strocov, Vladimir N.
AU - Hocevar, Moïra
AU - Palmstrøm, Chris
AU - Frolov, Sergey M.
AU - Marom, Noa
N1 - Publisher Copyright:
© 2023 The Authors. Published by American Chemical Society.
PY - 2023/6/28
Y1 - 2023/6/28
N2 - The original version of this article (https://pubs.acs.org/doi/full/10.1021/acsami.3c00323) contains errors in the affiliations of An-Hsi Chen, Yu-Hao Chang, Aaron Engel, Vladimir N. Strocov, Moï ra Hocevar, Chris Palmstrøm, and Noa Marom. These errors are misprints made by the publisher. They do not affect the scientific content of the paper. The correct affiliations are provided here: An-Hsi Chen: UniversitéGrenoble Alpes, CNRS, Grenoble INP, Institut Neel, ́ 38000 Grenoble, France. Yu-Hao Chang: Materials Department, University of California-Santa Barbara, Santa Barbara, California 93106, United States. Aaron Engel: Materials Department, University of California-Santa Barbara, Santa Barbara, California 93106, United States. Vladimir N. Strocov: Paul Scherrer Institut, Swiss Light Source, CH-5232 Villigen PSI, Switzerland. Moï ra Hocevar: Université Grenoble Alpes, CNRS, Grenoble INP, Institut Neel, ́ 38000 Grenoble, France. Chris Palmstrøm: Materials Department and Department of Electrical and Computer Engineering, University of California-Santa Barbara, Santa Barbara, California 93106, United States. Noa Marom: Department of Materials Science and Engineering, Department of Physics, and Department of Chemistry, Carnegie Mellon University, Pittsburgh, Pennsylvania 15213, United States.
AB - The original version of this article (https://pubs.acs.org/doi/full/10.1021/acsami.3c00323) contains errors in the affiliations of An-Hsi Chen, Yu-Hao Chang, Aaron Engel, Vladimir N. Strocov, Moï ra Hocevar, Chris Palmstrøm, and Noa Marom. These errors are misprints made by the publisher. They do not affect the scientific content of the paper. The correct affiliations are provided here: An-Hsi Chen: UniversitéGrenoble Alpes, CNRS, Grenoble INP, Institut Neel, ́ 38000 Grenoble, France. Yu-Hao Chang: Materials Department, University of California-Santa Barbara, Santa Barbara, California 93106, United States. Aaron Engel: Materials Department, University of California-Santa Barbara, Santa Barbara, California 93106, United States. Vladimir N. Strocov: Paul Scherrer Institut, Swiss Light Source, CH-5232 Villigen PSI, Switzerland. Moï ra Hocevar: Université Grenoble Alpes, CNRS, Grenoble INP, Institut Neel, ́ 38000 Grenoble, France. Chris Palmstrøm: Materials Department and Department of Electrical and Computer Engineering, University of California-Santa Barbara, Santa Barbara, California 93106, United States. Noa Marom: Department of Materials Science and Engineering, Department of Physics, and Department of Chemistry, Carnegie Mellon University, Pittsburgh, Pennsylvania 15213, United States.
UR - http://www.scopus.com/inward/record.url?scp=85163523492&partnerID=8YFLogxK
U2 - 10.1021/acsami.3c07924
DO - 10.1021/acsami.3c07924
M3 - Comment/debate
C2 - 37319365
AN - SCOPUS:85163523492
SN - 1944-8244
VL - 15
SP - 31100
EP - 31101
JO - ACS Applied Materials and Interfaces
JF - ACS Applied Materials and Interfaces
IS - 25
ER -