Epitaxial thin film growth of lanthanum and neodymium aluminate films on roll-textured nickel using a sol-gel method

Shara S. Shoup, M. Paranthaman, Amit Goyal, Eliot D. Specht, Dominic F. Lee, Donald M. Kroeger, David B. Beach

Research output: Contribution to journalArticlepeer-review

19 Scopus citations

Abstract

As part of an effort to develop a new, non-vacuum-processed substrate for high current superconducting films, thin films of LaAlO3 and NdAlO3 were deposited on biaxially textured (100) nickel substrates using a solution deposition technique. On heating to 1150°C in Ar-4% H2 for 1 h, epitaxial films were obtained. Out-of-plane alignment was confirmed by obtaining rocking curves of the (002) plane of the LaAlO3 (full width at half-maximum (fwhm) = 7.2°) and the NdAlO3 (fwhm = 5.8°) films. In-plane alignment was demonstrated by obtaining phi scans of the (110) plane of the LaAlO3 (fwhm = 13.4°) and the NdAlO3 (fwhm = 8.8°) films. Grain alignment in the films is approximately equivalent to the alignment of the Ni substrate. Analysis of pole figures indicated that in both films there are two in-plane orientations present, the major being (001)[100] and the minor (001)[110].

Original languageEnglish
Pages (from-to)3019-3021
Number of pages3
JournalJournal of the American Ceramic Society
Volume81
Issue number11
DOIs
StatePublished - Nov 1998

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