Epitaxial growth of non-c-oriented ferroelectric SrBi2Ta2O9 thin films on SrTiO3 substrates

Ho Nyung Lee, Stephan Senz, Alain Pignolet, Dietrich Hesse

Research output: Contribution to journalArticlepeer-review

14 Scopus citations

Abstract

Non-c-axis-oriented SrBi2Ta2O9 (SBT) epitaxial thin films with (116)-and (103)-orientations have been grown on Nb-doped (011)-and (111)-oriented SrTiO3 (STO) substrates by pulsed laser deposition, respectively. Analyses of the X-ray diffraction pole figures revealed that the three-dimensional epitaxy orientation relationship SBT (001)∥STO(001): SBT[11̄0]∥STO[100] is valid for both cases of SBT thin films, irrespective of STO orientations. The measured remanent polarizations (2Pr) of (116)-oriented and (103)-oriented SBT films were 9.6 and 10.4 μC/cm2, respectively, for a maximum applied electric field of 320 k V/cm. The dielectric constants of (116)-and (103)-oriented SBT were estimated as 155 and 189, respectively.

Original languageEnglish
Pages (from-to)1565-1568
Number of pages4
JournalJournal of the European Ceramic Society
Volume21
Issue number10-11
DOIs
StatePublished - 2001
Externally publishedYes

Keywords

  • Dielectric properties
  • Ferroelectric properties
  • Films
  • Perovskites
  • X-ray methods

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