Epitaxial growth of MgO/TiN multilayers on Cu

K. H. Kim, D. P. Norton, D. K. Christen, C. Cantoni, M. Paranthaman, T. Aytug

Research output: Contribution to journalArticlepeer-review

11 Scopus citations

Abstract

The growth of epitaxial MgO/TiN multilayer films on (001) Cu has been investigated. In particular, epitaxial structures were grown on (001) Cu layers that were epitaxial on (001) SrTiO3. X-ray diffraction and reflection high-energy electron diffraction indicate that the multilayer structures are epitaxial on the (001) Cu surface. The motivation is the use of crystalline MgO/TiN multilayers as a diffusion barrier to both copper and oxygen. MgO/TiN multilayers are potentially useful as diffusion barriers for Cu interconnects on semiconductors as well as for superconducting wires based on the epitaxial growth of cuprate superconductors on biaxially textured copper.

Original languageEnglish
Pages (from-to)897-901
Number of pages5
JournalVacuum
Volume83
Issue number5
DOIs
StatePublished - Jan 1 2009

Funding

This work was partially supported by the National Science Foundation under grant CHE-0304810. The ORNL research was sponsored by the U.S. Department of Energy under contract with UT-Battelle, LLC.

FundersFunder number
National Science FoundationCHE-0304810
U.S. Department of Energy
Oak Ridge National Laboratory

    Keywords

    • Copper
    • Diffusion barriers
    • Epitaxy
    • Magnesium oxide
    • Oxides
    • Pulsed-laser deposition
    • Superconductivity
    • Titanium nitride

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