Abstract
The growth of epitaxial MgO/TiN multilayer films on (001) Cu has been investigated. In particular, epitaxial structures were grown on (001) Cu layers that were epitaxial on (001) SrTiO3. X-ray diffraction and reflection high-energy electron diffraction indicate that the multilayer structures are epitaxial on the (001) Cu surface. The motivation is the use of crystalline MgO/TiN multilayers as a diffusion barrier to both copper and oxygen. MgO/TiN multilayers are potentially useful as diffusion barriers for Cu interconnects on semiconductors as well as for superconducting wires based on the epitaxial growth of cuprate superconductors on biaxially textured copper.
Original language | English |
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Pages (from-to) | 897-901 |
Number of pages | 5 |
Journal | Vacuum |
Volume | 83 |
Issue number | 5 |
DOIs | |
State | Published - Jan 1 2009 |
Funding
This work was partially supported by the National Science Foundation under grant CHE-0304810. The ORNL research was sponsored by the U.S. Department of Energy under contract with UT-Battelle, LLC.
Funders | Funder number |
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National Science Foundation | CHE-0304810 |
U.S. Department of Energy | |
Oak Ridge National Laboratory |
Keywords
- Copper
- Diffusion barriers
- Epitaxy
- Magnesium oxide
- Oxides
- Pulsed-laser deposition
- Superconductivity
- Titanium nitride