Epitaxial growth of La2Zr2O7 thin films on rolled Ni-substrates by sol-gel process for high Tc superconducting tapes

T. G. Chirayil, M. Paranthaman, D. B. Beach, D. F. Lee, A. Goyal, R. K. Williams, X. Cui, D. M. Kroeger, R. Feenstra, D. T. Verebelyi, D. K. Christen

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74 Scopus citations

Abstract

A solution process was used to grow epitaxial La2Zr2O7 (LZO) buffer layers on roll-textured Ni (100) substrates to produce YBa2Cu3O7-δ (YBCO)-coated conductors. The LZO precursor solution was prepared by an all alkoxide sol-gel route using mixed metal methoxyethoxides in 2-methoxyethanol. The partially hydrolyzed solution was either spin-coated or dip-coated onto the textured Ni substrates. The amorphous thin film was then heat treated at 1150 °C under (96%)Ar/(4%)H2 atmosphere for 1 h. X-ray diffraction (XRD) of the buffer layer indicated a strong c-axis orientation on the Ni (100) substrate. The LZO (222) pole figure revealed a single cube-on-cube texture. SEM images of the LZO buffer layer showed a dense microstructure without cracks. The YBCO deposited on the sol-gel LZO-buffered Ni substrates with sputtered YSZ and CeO2 top layers had a critical current density of 480,000 A/cm2 at 77 K and self-field.

Original languageEnglish
Pages (from-to)63-69
Number of pages7
JournalPhysica C: Superconductivity and its Applications
Volume336
Issue number1
DOIs
StatePublished - Jul 1 2000

Funding

This research is sponsored by the U.S. Department of Energy, Division of Materials Sciences, Office of Science, Office of Energy Efficiency and Renewable Energy, and Office of Utility Technology-Superconductivity Program. This research was supported in part by an appointment to the Oak Ridge National Laboratory Postdoctoral Research Associates Program administered jointly by the Oak Ridge National Laboratory and the Oak Ridge Institute for Science and Education. Oak Ridge National Laboratory is managed by Lockheed Martin Energy Research for U.S. Department of Energy under contract #DE-AC05-96OR22464. The authors would like to acknowledge J.C. Bryan for his help with the high temperature X-ray diffractometer.

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