Epitaxial growth and properties of metastable BiMnO 3 thin films

António F.Moreira Dos Santos; Anthony K. Cheetham; Wei Tian; Xiaoqing Pan; Yunfa Jia; Nathan J. Murphy; James Lettieri; Darrell G. Schlom

doi:10.1063/1.1636265

Epitaxial growth and properties of metastable BiMnO ₃ thin films

António F.Moreira Dos Santos
, Anthony K. Cheetham
, Wei Tian
, Xiaoqing Pan
, Yunfa Jia
, Nathan J. Murphy
, James Lettieri
, Darrell G. Schlom

Research output: Contribution to journal › Article › peer-review

97 Scopus citations

Abstract

The deposition of epitaxial thin films of BiMnO ₃ on single-crystal substrates of (100)-oriented SrTiO ₃ by pulsed-laser deposition was described. These films were deposited using pulsed laser deposition (PLD) system equipped with a KrF excimer laser (248 nm, Lambda Physik EMG103MSC) in an on-axis geometry. The structural analysis of epitaxial thin films by X-ray diffraction, electron diffraction and transmission electron microscopy (TEM) indicated that the films were monoclinic and twinned with two dominant orientation relationships. The collection of X-ray diffraction (XRD) patterns using a Picker four-circle X-ray diffractometer with CuK _α radiation and a graphite monochromator was also discussed.

Original language	English
Pages (from-to)	91-93
Number of pages	3
Journal	Applied Physics Letters
Volume	84
Issue number	1
DOIs	https://doi.org/10.1063/1.1636265
State	Published - Jan 5 2004
Externally published	Yes

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title = "Epitaxial growth and properties of metastable BiMnO 3 thin films",

abstract = "The deposition of epitaxial thin films of BiMnO 3 on single-crystal substrates of (100)-oriented SrTiO 3 by pulsed-laser deposition was described. These films were deposited using pulsed laser deposition (PLD) system equipped with a KrF excimer laser (248 nm, Lambda Physik EMG103MSC) in an on-axis geometry. The structural analysis of epitaxial thin films by X-ray diffraction, electron diffraction and transmission electron microscopy (TEM) indicated that the films were monoclinic and twinned with two dominant orientation relationships. The collection of X-ray diffraction (XRD) patterns using a Picker four-circle X-ray diffractometer with CuK α radiation and a graphite monochromator was also discussed.",

author = "\{Dos Santos\}, \{Ant{\'o}nio F.Moreira\} and Cheetham, \{Anthony K.\} and Wei Tian and Xiaoqing Pan and Yunfa Jia and Murphy, \{Nathan J.\} and James Lettieri and Schlom, \{Darrell G.\}",

year = "2004",

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doi = "10.1063/1.1636265",

language = "English",

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T1 - Epitaxial growth and properties of metastable BiMnO 3 thin films

AU - Dos Santos, António F.Moreira

AU - Cheetham, Anthony K.

AU - Tian, Wei

AU - Pan, Xiaoqing

AU - Jia, Yunfa

AU - Murphy, Nathan J.

AU - Lettieri, James

AU - Schlom, Darrell G.

PY - 2004/1/5

Y1 - 2004/1/5

N2 - The deposition of epitaxial thin films of BiMnO 3 on single-crystal substrates of (100)-oriented SrTiO 3 by pulsed-laser deposition was described. These films were deposited using pulsed laser deposition (PLD) system equipped with a KrF excimer laser (248 nm, Lambda Physik EMG103MSC) in an on-axis geometry. The structural analysis of epitaxial thin films by X-ray diffraction, electron diffraction and transmission electron microscopy (TEM) indicated that the films were monoclinic and twinned with two dominant orientation relationships. The collection of X-ray diffraction (XRD) patterns using a Picker four-circle X-ray diffractometer with CuK α radiation and a graphite monochromator was also discussed.

AB - The deposition of epitaxial thin films of BiMnO 3 on single-crystal substrates of (100)-oriented SrTiO 3 by pulsed-laser deposition was described. These films were deposited using pulsed laser deposition (PLD) system equipped with a KrF excimer laser (248 nm, Lambda Physik EMG103MSC) in an on-axis geometry. The structural analysis of epitaxial thin films by X-ray diffraction, electron diffraction and transmission electron microscopy (TEM) indicated that the films were monoclinic and twinned with two dominant orientation relationships. The collection of X-ray diffraction (XRD) patterns using a Picker four-circle X-ray diffractometer with CuK α radiation and a graphite monochromator was also discussed.

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U2 - 10.1063/1.1636265

DO - 10.1063/1.1636265

M3 - Article

AN - SCOPUS:0942289169

SN - 0003-6951

VL - 84

SP - 91

EP - 93

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 1

ER -

Epitaxial growth and properties of metastable BiMnO ₃ thin films

Abstract

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