Abstract
The epitaxial growth and properties of Mn2+-doped ZnGa2O4 thin films on various single crystal substrates using pulsed laser deposition were investigated. Control of Zn/Ga stoichiometry required the use of a mosaic ZnGa2O4/ZnO ablation target to compensate for Zn loss due to evaporation. The photoluminescent intensity was a strong function of the Zn/Ga ratio, and also correlated with changes in the surface morphology. Superior photoluminescent intensity was attained from slightly Zn-deficient films which exhibit distinctive worm-like surface features. Enhanced photoluminescent intensity was observed in epitaxial films as compared to randomly-oriented polycrystalline deposits on glass substrates, suggesting an adverse effect of grain boundaries on luminescence properties.
Original language | English |
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Pages (from-to) | 293-297 |
Number of pages | 5 |
Journal | Journal of Electroceramics |
Volume | 4 |
Issue number | 2 |
DOIs | |
State | Published - 2000 |
Event | 5th International Workshop on Oxide Electronics - Maryland, MD, USA Duration: Dec 7 1998 → Dec 8 1998 |
Funding
This research was sponsored by the Oak Ridge National Laboratory, managed by Lockheed Martin Energy Research Corp., for the U.S. Department of Energy, under contract DE-AC05-96OR22464.