Epitaxial growth and electrical properties of VO2 on [LaAlO3]0.3[Sr2AlTaO6]0.7 (111) substrate

Yang Liu, Shanyuan Niu, Thomas Orvis, Haimeng Zhang, Huan Zhao, Han Wang, Jayakanth Ravichandran

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Abstract

The authors report the epitaxial growth and the electrical properties, especially the metal-to-insulator transition, of vanadium dioxide (VO2) thin films synthesized on [LaAlO3]0.3[Sr2AlTaO6]0.7 (LSAT) (111) (LSAT) substrates by pulsed laser deposition. X-ray diffraction studies show that the epitaxial relationship between the VO2 thin films and LSAT substrate is given as VO2(020)||LSAT(111) and V O 2 [001] | | LSAT [11 2]. The authors observed a sharp 4 orders of magnitude change in the longitudinal resistance for the VO2 thin films around the transition temperature. The authors also measured distinct Raman spectra below and above the transition point indicating a concomitant structural transition between the insulator and metallic phases, in agreement with past investigations.

Original languageEnglish
Article number061506
JournalJournal of Vacuum Science and Technology, Part A: Vacuum, Surfaces and Films
Volume36
Issue number6
DOIs
StatePublished - Nov 1 2018
Externally publishedYes

Funding

The authors gratefully acknowledge support from the Air Force Office of Scientific Research with Grant No. FA9550-16-1-0335. S.N. acknowledges the Link Foundation Energy Fellowship. The authors acknowledge the technical assistance of Shengyuan Bai and Boyang Zhao and the use of the

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