Abstract
ArC60 synthesized by heating primarily C60 (with trace amounts of C70 under a high pressure of argon gas,was purified by high-performance liquid chromatography (HPLC) and examined by Fourier transform mass spectrometry (FTMS). The sample, which consisted of 0.1% ArC60, was dissolved in toluene and separated with HPLC using a COSMOSIL 5PYE column as the stationary phase and toluene as the eluent (UV detection). ArC60 was enriched by a factor of about 400 relative to the starting material. ArC60 was also examined by X-ray photoelectron spectroscopy (XPS) but was found to be sensitive to radiation damage and subsequent depletion. Low-energy collisional dissociation of Ar$+$/ C60+ in the FTMS yields primarily C58+, generated by loss of the argon atom and C2. The ionization potential of Ar$+$/C60 was bracketed by charge-exchange reactions and was found to be between 7.53 and 7.8 eV, which is indistinguishable from that of C60 (7.65 eV).
| Original language | English |
|---|---|
| Pages (from-to) | 9197-9201 |
| Number of pages | 5 |
| Journal | Journal of Physical Chemistry |
| Volume | 100 |
| Issue number | 22 |
| DOIs | |
| State | Published - Jan 1 1996 |
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