Enrichment and characterization of a noble gas fullerene: ArC60

Barbara A. Dicamillo, Robert L. Hettich, Georges Guiochon, Robert N. Compton, Martin Saunders, Hugo A. Jimenez-Vazquez, Anthony Khong, R. James Cross

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Abstract

ArC60 synthesized by heating primarily C60 (with trace amounts of C70 under a high pressure of argon gas,was purified by high-performance liquid chromatography (HPLC) and examined by Fourier transform mass spectrometry (FTMS). The sample, which consisted of 0.1% ArC60, was dissolved in toluene and separated with HPLC using a COSMOSIL 5PYE column as the stationary phase and toluene as the eluent (UV detection). ArC60 was enriched by a factor of about 400 relative to the starting material. ArC60 was also examined by X-ray photoelectron spectroscopy (XPS) but was found to be sensitive to radiation damage and subsequent depletion. Low-energy collisional dissociation of Ar$+$/ C60+ in the FTMS yields primarily C58+, generated by loss of the argon atom and C2. The ionization potential of Ar$+$/C60 was bracketed by charge-exchange reactions and was found to be between 7.53 and 7.8 eV, which is indistinguishable from that of C60 (7.65 eV).

Original languageEnglish
Pages (from-to)9197-9201
Number of pages5
JournalJournal of Physical Chemistry
Volume100
Issue number22
DOIs
StatePublished - Jan 1 1996

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