Abstract
Vanadium dioxide (VO2) in bulk, thin-film, and nanostructured forms exhibits an insulator-to-metal transition accompanied by structural reorganization, induced by temperature, light, electric fields, doping, or strain. We have grown epitaxial films of VO2 on c-cut (0001) sapphire following two different procedures: (1) room-temperature growth followed by annealing and (2) direct high-temperature growth. We find that variations in strain at the film-substrate interface in the two protocols leads to differences in morphologies and transition characteristics. Our results show that room-temperature-grown epitaxial films have smoother morphologies and better switching contrast, analogous to the enhanced performance of epitaxially grown compound semiconductors.
Original language | English |
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Article number | 251916 |
Journal | Applied Physics Letters |
Volume | 98 |
Issue number | 25 |
DOIs | |
State | Published - Jun 20 2011 |
Funding
Research at Vanderbilt University was supported by National Science Foundation (Grant No. ECS-0801985). Portions of this research were supported by the Oak Ridge National Laboratory's CNMS and SHaRE User Facilities, both sponsored by the Division of Scientific User Facilities, Office of Basic Energy Science, U.S. Department of Energy.
Funders | Funder number |
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Division of Scientific User Facilities | |
Office of Basic Energy Science | |
National Science Foundation | |
U.S. Department of Energy | |
Oak Ridge National Laboratory |