Enhanced flux pinning in MOCVD-YBCO films through Zr additions: Systematic feasibility studies

T. Aytug; M. Paranthaman; E. D. Specht; Y. Zhang; K. Kim; Y. L. Zuev; C. Cantoni; A. Goyal; D. K. Christen; V. A. Maroni; Y. Chen; V. Selvamanickam

doi:10.1088/0953-2048/23/1/014005

Enhanced flux pinning in MOCVD-YBCO films through Zr additions: Systematic feasibility studies

T. Aytug
, M. Paranthaman
, E. D. Specht
, Y. Zhang
, K. Kim
, Y. L. Zuev
, C. Cantoni
, A. Goyal
, D. K. Christen
, V. A. Maroni
, Y. Chen
, V. Selvamanickam

Nanomaterials Chemistry Group

Research output: Contribution to journal › Article › peer-review

52 Scopus citations

Abstract

Systematic effects of Zr additions on the structural and flux pinning properties of YBa₂Cu₃O_7-δ (YBCO) films deposited by metal-organic chemical vapor deposition (MOCVD) have been investigated. Detailed characterization, conducted by coordinated transport, x-ray diffraction, scanning and transmission electron microscopy analyses, and imaging Raman microscopy have revealed trends in the resulting property/performance correlations of these films with respect to varying mole percentages (mol%) of added Zr. For compositions ≤7.5mol%, Zr additions lead to improved in-field critical current density, as well as extra correlated pinning along the c-axis direction of the YBCO films via the formation of columnar, self-assembled stacks of BaZrO₃ nanodots.

Original language	English
Article number	014005
Journal	Superconductor Science and Technology
Volume	23
Issue number	1
DOIs	https://doi.org/10.1088/0953-2048/23/1/014005
State	Published - 2010

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Aytug, T., Paranthaman, M., Specht, E. D., Zhang, Y., Kim, K., Zuev, Y. L., Cantoni, C., Goyal, A., Christen, D. K., Maroni, V. A., Chen, Y., & Selvamanickam, V. (2010). Enhanced flux pinning in MOCVD-YBCO films through Zr additions: Systematic feasibility studies. Superconductor Science and Technology, 23(1), Article 014005. https://doi.org/10.1088/0953-2048/23/1/014005

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title = "Enhanced flux pinning in MOCVD-YBCO films through Zr additions: Systematic feasibility studies",

abstract = "Systematic effects of Zr additions on the structural and flux pinning properties of YBa2Cu3O7-δ (YBCO) films deposited by metal-organic chemical vapor deposition (MOCVD) have been investigated. Detailed characterization, conducted by coordinated transport, x-ray diffraction, scanning and transmission electron microscopy analyses, and imaging Raman microscopy have revealed trends in the resulting property/performance correlations of these films with respect to varying mole percentages (mol\%) of added Zr. For compositions ≤7.5mol\%, Zr additions lead to improved in-field critical current density, as well as extra correlated pinning along the c-axis direction of the YBCO films via the formation of columnar, self-assembled stacks of BaZrO3 nanodots.",

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year = "2010",

doi = "10.1088/0953-2048/23/1/014005",

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T2 - Systematic feasibility studies

AU - Aytug, T.

AU - Paranthaman, M.

AU - Specht, E. D.

AU - Zhang, Y.

AU - Kim, K.

AU - Zuev, Y. L.

AU - Cantoni, C.

AU - Goyal, A.

AU - Christen, D. K.

AU - Maroni, V. A.

AU - Chen, Y.

AU - Selvamanickam, V.

PY - 2010

Y1 - 2010

N2 - Systematic effects of Zr additions on the structural and flux pinning properties of YBa2Cu3O7-δ (YBCO) films deposited by metal-organic chemical vapor deposition (MOCVD) have been investigated. Detailed characterization, conducted by coordinated transport, x-ray diffraction, scanning and transmission electron microscopy analyses, and imaging Raman microscopy have revealed trends in the resulting property/performance correlations of these films with respect to varying mole percentages (mol%) of added Zr. For compositions ≤7.5mol%, Zr additions lead to improved in-field critical current density, as well as extra correlated pinning along the c-axis direction of the YBCO films via the formation of columnar, self-assembled stacks of BaZrO3 nanodots.

AB - Systematic effects of Zr additions on the structural and flux pinning properties of YBa2Cu3O7-δ (YBCO) films deposited by metal-organic chemical vapor deposition (MOCVD) have been investigated. Detailed characterization, conducted by coordinated transport, x-ray diffraction, scanning and transmission electron microscopy analyses, and imaging Raman microscopy have revealed trends in the resulting property/performance correlations of these films with respect to varying mole percentages (mol%) of added Zr. For compositions ≤7.5mol%, Zr additions lead to improved in-field critical current density, as well as extra correlated pinning along the c-axis direction of the YBCO films via the formation of columnar, self-assembled stacks of BaZrO3 nanodots.

UR - https://www.scopus.com/pages/publications/76749127555

U2 - 10.1088/0953-2048/23/1/014005

DO - 10.1088/0953-2048/23/1/014005

M3 - Article

AN - SCOPUS:76749127555

SN - 0953-2048

VL - 23

JO - Superconductor Science and Technology

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ER -

Enhanced flux pinning in MOCVD-YBCO films through Zr additions: Systematic feasibility studies

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