Enhanced flux pinning in MOCVD-YBCO films through Zr additions: Systematic feasibility studies

T. Aytug; M. Paranthaman; E. D. Specht; Y. Zhang; K. Kim; Y. L. Zuev; C. Cantoni; A. Goyal; D. K. Christen; V. A. Maroni; Y. Chen; V. Selvamanickam

doi:10.1088/0953-2048/23/1/014005

Enhanced flux pinning in MOCVD-YBCO films through Zr additions: Systematic feasibility studies

T. Aytug, M. Paranthaman, E. D. Specht, Y. Zhang, K. Kim, Y. L. Zuev, C. Cantoni, A. Goyal, D. K. Christen, V. A. Maroni, Y. Chen, V. Selvamanickam

Nanomaterials Chemistry Group

Research output: Contribution to journal › Article › peer-review

50 Scopus citations

Abstract

Systematic effects of Zr additions on the structural and flux pinning properties of YBa₂Cu₃O_7-δ (YBCO) films deposited by metal-organic chemical vapor deposition (MOCVD) have been investigated. Detailed characterization, conducted by coordinated transport, x-ray diffraction, scanning and transmission electron microscopy analyses, and imaging Raman microscopy have revealed trends in the resulting property/performance correlations of these films with respect to varying mole percentages (mol%) of added Zr. For compositions ≤7.5mol%, Zr additions lead to improved in-field critical current density, as well as extra correlated pinning along the c-axis direction of the YBCO films via the formation of columnar, self-assembled stacks of BaZrO₃ nanodots.

Original language	English
Article number	014005
Journal	Superconductor Science and Technology
Volume	23
Issue number	1
DOIs	https://doi.org/10.1088/0953-2048/23/1/014005
State	Published - 2010

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Aytug, T., Paranthaman, M., Specht, E. D., Zhang, Y., Kim, K., Zuev, Y. L., Cantoni, C., Goyal, A., Christen, D. K., Maroni, V. A., Chen, Y., & Selvamanickam, V. (2010). Enhanced flux pinning in MOCVD-YBCO films through Zr additions: Systematic feasibility studies. Superconductor Science and Technology, 23(1), Article 014005. https://doi.org/10.1088/0953-2048/23/1/014005

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abstract = "Systematic effects of Zr additions on the structural and flux pinning properties of YBa2Cu3O7-δ (YBCO) films deposited by metal-organic chemical vapor deposition (MOCVD) have been investigated. Detailed characterization, conducted by coordinated transport, x-ray diffraction, scanning and transmission electron microscopy analyses, and imaging Raman microscopy have revealed trends in the resulting property/performance correlations of these films with respect to varying mole percentages (mol%) of added Zr. For compositions ≤7.5mol%, Zr additions lead to improved in-field critical current density, as well as extra correlated pinning along the c-axis direction of the YBCO films via the formation of columnar, self-assembled stacks of BaZrO3 nanodots.",

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AU - Aytug, T.

AU - Paranthaman, M.

AU - Specht, E. D.

AU - Zhang, Y.

AU - Kim, K.

AU - Zuev, Y. L.

AU - Cantoni, C.

AU - Goyal, A.

AU - Christen, D. K.

AU - Maroni, V. A.

AU - Chen, Y.

AU - Selvamanickam, V.

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AB - Systematic effects of Zr additions on the structural and flux pinning properties of YBa2Cu3O7-δ (YBCO) films deposited by metal-organic chemical vapor deposition (MOCVD) have been investigated. Detailed characterization, conducted by coordinated transport, x-ray diffraction, scanning and transmission electron microscopy analyses, and imaging Raman microscopy have revealed trends in the resulting property/performance correlations of these films with respect to varying mole percentages (mol%) of added Zr. For compositions ≤7.5mol%, Zr additions lead to improved in-field critical current density, as well as extra correlated pinning along the c-axis direction of the YBCO films via the formation of columnar, self-assembled stacks of BaZrO3 nanodots.

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Enhanced flux pinning in MOCVD-YBCO films through Zr additions: Systematic feasibility studies

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