Enhanced flux-pinning in dy-doped, MOD YBCO films on RABiTS

A. Goyal, J. Li, P. M. Martin, A. Gapud, E. D. Specht, M. Paranthaman, X. Li, W. Zhang, T. Kodenkandath, M. W. Rupich

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14 Scopus citations

Abstract

Significant enhancements in flux-pinning were obtained for Dy-doped, YBCO films via a metalorganic deposition (MOD) process on rolling-assisted biaxially textured substrates (RABiTS). It has been reported previously that incorporation of excess rare-earth ions during the MOD process, results in improvement of Jc for H//c, however, a decrease in Jc for H//ab is observed. We report here that by altering the processing conditions the reduction in the magnitude of the current peak for H//ab can be minimized while significantly enhancing the random pinning at all field orientations. The result is a YBCO film with significantly reduced anisotropy compared to the typical YBCO films prepared by the MOD process. This is accomplished by incorporating both a high density of stacking faults and (Dy, Y)2O3 nanoparticles which result in the strong pinning for H//ab and a broad pinning peak for H//c respectively.

Original languageEnglish
Pages (from-to)3340-3342
Number of pages3
JournalIEEE Transactions on Applied Superconductivity
Volume17
Issue number2
DOIs
StatePublished - Jun 2007

Funding

Manuscript received August 26, 2006. This work was supported by the U.S. Department of Energy, Office of Electricity Delivery and Energy Reliability-Superconductivity Program, under Contract DE-AC05-00OR22725 with UT-Bat-telle, LLC managing contractor for Oak Ridge National Laboratory. J. Li would like to thank Oak Ridge Associated Universities for a postdoctoral fellowship. A. Goyal, J. Li, P. M. Martin, E. D. Specht, and M. Paranthaman are with Oak Ridge National Laboratory, Oak Ridge, TN 37831 USA (e-mail: goyala@ornl. gov). A. Gapud is with the University of South Alabama, Mobile, AL 36688 USA. X. Li and M. W. Rupich are with American Superconductor Corporation, Westborough, MA 01581 USA. Color versions of one or more of the figures in this paper are available online at http://ieeexplore.ieee.org. Digital Object Identifier 10.1109/TASC.2007.898957

FundersFunder number
U.S. Department of EnergyDE-AC05-00OR22725
Oak Ridge Associated Universities
Oak Ridge National Laboratory

    Keywords

    • Angular dependence
    • Coated conductor
    • Critical current density
    • Flux-pinning
    • Intergrowths
    • MOD films
    • Nanodots
    • RABiTS
    • Stacking faults
    • Wires

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