Energy-dispersive surface X-ray scattering study of thin ceria overlayer on zirconia: Structural evolution with temperature

W. Dmowski; E. Mamontov; T. Egami; S. Putna; R. Gorte

doi:10.1016/S0921-4526(98)00210-5

Energy-dispersive surface X-ray scattering study of thin ceria overlayer on zirconia: Structural evolution with temperature

W. Dmowski, E. Mamontov, T. Egami, S. Putna, R. Gorte

Research output: Contribution to journal › Article › peer-review

18 Scopus citations

Abstract

We have studied the structure of ultra-thin CeO₂ overlayer on single crystals of Y stabilized cubic zirconia (ZrO₂) by energy dispersive surface X-ray scattering. The overlayers were formed by depositing cerium metal and annealing in oxygen atmosphere. Three different crystallographic surfaces, (0 0 1), (0 1 1) and (1 1 1), were examined. We observed formation of CeO₂ overlayer with thickness of 10-40 Å and lateral coherence length of 20-70 Å depending on the sample. In addition, we performed in situ temperature study of a sample with (0 0 1) surface. A zirconia crystal with cerium metal deposited on the surface was placed on a substrate heater and was annealed in air during in situ surface X-ray diffraction. We observed the formation of a ceria epitaxial film at 420°C followed by a preferential grain growth at higher temperatures and finally the diffusion of Ce into the bulk above 700°C.

Original language	English
Pages (from-to)	95-100
Number of pages	6
Journal	Physica B: Physics of Condensed Matter
Volume	248
Issue number	1-4
DOIs	https://doi.org/10.1016/S0921-4526(98)00210-5
State	Published - Jun 15 1998
Externally published	Yes

Funding

This research was supported by the US Department of Energy and the National Science Foundation through the Automotive Initiative Grant DE-FG02-96ER14682.A000. The use of the facilities of the Laboratory for Research on the Structure of Matter, MRSEC Shared Experimental Facilities supported by the National Science Foundation under Award DMR96-32598 is acknowledged. The National Synchrotron Light Source is operated US Department of Energy, Division of Materials Sciences and Chemical Sciences.

Keywords

Catalyst support
Ceria
Epitaxial film
Surface X-ray diffraction

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10.1016/S0921-4526(98)00210-5

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title = "Energy-dispersive surface X-ray scattering study of thin ceria overlayer on zirconia: Structural evolution with temperature",

abstract = "We have studied the structure of ultra-thin CeO2 overlayer on single crystals of Y stabilized cubic zirconia (ZrO2) by energy dispersive surface X-ray scattering. The overlayers were formed by depositing cerium metal and annealing in oxygen atmosphere. Three different crystallographic surfaces, (0 0 1), (0 1 1) and (1 1 1), were examined. We observed formation of CeO2 overlayer with thickness of 10-40 {\AA} and lateral coherence length of 20-70 {\AA} depending on the sample. In addition, we performed in situ temperature study of a sample with (0 0 1) surface. A zirconia crystal with cerium metal deposited on the surface was placed on a substrate heater and was annealed in air during in situ surface X-ray diffraction. We observed the formation of a ceria epitaxial film at 420°C followed by a preferential grain growth at higher temperatures and finally the diffusion of Ce into the bulk above 700°C.",

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author = "W. Dmowski and E. Mamontov and T. Egami and S. Putna and R. Gorte",

year = "1998",

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T1 - Energy-dispersive surface X-ray scattering study of thin ceria overlayer on zirconia

T2 - Structural evolution with temperature

AU - Dmowski, W.

AU - Mamontov, E.

AU - Egami, T.

AU - Putna, S.

AU - Gorte, R.

PY - 1998/6/15

Y1 - 1998/6/15

N2 - We have studied the structure of ultra-thin CeO2 overlayer on single crystals of Y stabilized cubic zirconia (ZrO2) by energy dispersive surface X-ray scattering. The overlayers were formed by depositing cerium metal and annealing in oxygen atmosphere. Three different crystallographic surfaces, (0 0 1), (0 1 1) and (1 1 1), were examined. We observed formation of CeO2 overlayer with thickness of 10-40 Å and lateral coherence length of 20-70 Å depending on the sample. In addition, we performed in situ temperature study of a sample with (0 0 1) surface. A zirconia crystal with cerium metal deposited on the surface was placed on a substrate heater and was annealed in air during in situ surface X-ray diffraction. We observed the formation of a ceria epitaxial film at 420°C followed by a preferential grain growth at higher temperatures and finally the diffusion of Ce into the bulk above 700°C.

AB - We have studied the structure of ultra-thin CeO2 overlayer on single crystals of Y stabilized cubic zirconia (ZrO2) by energy dispersive surface X-ray scattering. The overlayers were formed by depositing cerium metal and annealing in oxygen atmosphere. Three different crystallographic surfaces, (0 0 1), (0 1 1) and (1 1 1), were examined. We observed formation of CeO2 overlayer with thickness of 10-40 Å and lateral coherence length of 20-70 Å depending on the sample. In addition, we performed in situ temperature study of a sample with (0 0 1) surface. A zirconia crystal with cerium metal deposited on the surface was placed on a substrate heater and was annealed in air during in situ surface X-ray diffraction. We observed the formation of a ceria epitaxial film at 420°C followed by a preferential grain growth at higher temperatures and finally the diffusion of Ce into the bulk above 700°C.

KW - Catalyst support

KW - Ceria

KW - Epitaxial film

KW - Surface X-ray diffraction

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U2 - 10.1016/S0921-4526(98)00210-5

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M3 - Article

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SN - 0921-4526

VL - 248

SP - 95

EP - 100

JO - Physica B: Physics of Condensed Matter

JF - Physica B: Physics of Condensed Matter

IS - 1-4

ER -

Energy-dispersive surface X-ray scattering study of thin ceria overlayer on zirconia: Structural evolution with temperature

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