TY - GEN
T1 - Emittance scanner optimization for low-energy ion beams
AU - Stockli, M. P.
AU - Welton, R. F.
PY - 2005
Y1 - 2005
N2 - Ion beam emittances are normally measured as two-dimensional distributions of the beam current fraction within a narrow window Δx centered at position coordinate x and a narrow window Δx′ centered at trajectory angle x′. The small fraction of the beam current found within both of these windows causes the measured emittance signals to be sensitive to noise, bias, and other unwanted signals. One example of unwanted signals is slit scattering that is discussed in detail for low-energy ion beams.
AB - Ion beam emittances are normally measured as two-dimensional distributions of the beam current fraction within a narrow window Δx centered at position coordinate x and a narrow window Δx′ centered at trajectory angle x′. The small fraction of the beam current found within both of these windows causes the measured emittance signals to be sensitive to noise, bias, and other unwanted signals. One example of unwanted signals is slit scattering that is discussed in detail for low-energy ion beams.
UR - http://www.scopus.com/inward/record.url?scp=33847009303&partnerID=8YFLogxK
U2 - 10.1109/PAC.2005.1591235
DO - 10.1109/PAC.2005.1591235
M3 - Conference contribution
AN - SCOPUS:33847009303
SN - 0780388593
SN - 9780780388598
T3 - Proceedings of the IEEE Particle Accelerator Conference
SP - 2705
EP - 2707
BT - Proceedings of the Particle Accelerator Conference, PAC 2005
T2 - Particle Accelerator Conference, PAC 2005
Y2 - 16 May 2005 through 20 May 2005
ER -