Abstract
The first investigation of the transverse emittance of a hot-cavity laser ion source based on all-solid-state Ti:sapphire lasers is presented. The emittances of C 63 u ion beams generated by three-photon resonant ionization are measured and compared with that of the G 69 a and K 39 ion beams resulting from surface ionization in the same ion source. A self-consistent unbiased elliptical exclusion method is adapted for noise reduction and emittance analysis. Typical values of the rms and 90% fractional emittances of the Cu ion beams at 20 keV energy are found to be about 2 and 8 π mm mrad, respectively, for the ion currents of 2-40 nA investigated. The emittances of the laser-produced Cu ion beams are smaller than those of the surface-ionized Ga and K ion beams.
| Original language | English |
|---|---|
| Article number | 083304 |
| Journal | Review of Scientific Instruments |
| Volume | 80 |
| Issue number | 8 |
| DOIs | |
| State | Published - 2009 |
Funding
This research has been sponsored by the US Department of Energy, under Contract No. DE-AC05-00OR22725 with UT-Battelle, LLC, as well as by the German Bundesministerium für Bildung und Forschung under Contract Nos. 06MZ197 and 06MZ215, and by the European Union Sixth Framework through RII3-EURONS (Contract No. 506065).