Abstract
Interfaces play a fundamental role in many areas of chemistry. However, their localized nature requires characterization techniques with high spatial resolution in order to fully understand their structure and properties. State-of-the-art atomic resolution or in situ scanning transmission electron microscopy and electron energy-loss spectroscopy are indispensable tools for characterizing the local structure and chemistry of materials with single-atom resolution, but they are not able to measure many properties that dictate function, such as vibrational modes or charge transfer, and are limited to room-temperature samples containing no liquids. Here, we outline emerging electron microscopy techniques that are allowing these limitations to be overcome and highlight several recent studies that were enabled by these techniques. We then provide a vision for how these techniques can be paired with each other and with in situ methods to deliver new insights into the static and dynamic behavior of functional interfaces.
Original language | English |
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Pages (from-to) | 1384-1396 |
Number of pages | 13 |
Journal | Angewandte Chemie - International Edition |
Volume | 59 |
Issue number | 4 |
DOIs | |
State | Published - Jan 20 2020 |
Funding
This research was conducted at the Center for Nanophase Materials Sciences, which is a DOE Office of Science User Facility. Figures a, b, c, a, b, and b are licensed under CC BY 4.0: https://creativecommons.org/licenses/by/4.0/#.
Funders | Funder number |
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DOE Office of Science |
Keywords
- 4D electron microscopy
- STEM
- cryo-electron microscopy
- interfaces
- monochromated EELS