Electrostrictive and electrostatic responses in contact mode voltage modulated scanning probe microscopies

Eugene A. Eliseev; Anna N. Morozovska; Anton V. Ievlev; Nina Balke; Peter Maksymovych; Alexander Tselev; Sergei V. Kalinin

doi:10.1063/1.4882861

Electrostrictive and electrostatic responses in contact mode voltage modulated scanning probe microscopies

Eugene A. Eliseev, Anna N. Morozovska, Anton V. Ievlev, Nina Balke, Peter Maksymovych, Alexander Tselev, Sergei V. Kalinin

Functional Atomic Force Microscopy Group

Research output: Contribution to journal › Article › peer-review

42 Scopus citations

Abstract

Electromechanical response of solids underpins image formation mechanism of several scanning probe microscopy techniques including the piezoresponse force microscopy (PFM) and electrochemical strain microscopy (ESM). While the theory of linear piezoelectric and ionic responses are well developed, the contributions of quadratic effects including electrostriction and capacitive tip-surface forces to measured signal remain poorly understood. Here, we analyze the electrostrictive and capacitive contributions to the PFM and ESM signals and discuss the implications of the dielectric tip-surface gap on these interactions.

Original language	English
Article number	232901
Journal	Applied Physics Letters
Volume	104
Issue number	23
DOIs	https://doi.org/10.1063/1.4882861
State	Published - Jun 9 2014

Access to Document

10.1063/1.4882861

Cite this

@article{e6512347c1a547faaa0c445342e27bf9,

title = "Electrostrictive and electrostatic responses in contact mode voltage modulated scanning probe microscopies",

abstract = "Electromechanical response of solids underpins image formation mechanism of several scanning probe microscopy techniques including the piezoresponse force microscopy (PFM) and electrochemical strain microscopy (ESM). While the theory of linear piezoelectric and ionic responses are well developed, the contributions of quadratic effects including electrostriction and capacitive tip-surface forces to measured signal remain poorly understood. Here, we analyze the electrostrictive and capacitive contributions to the PFM and ESM signals and discuss the implications of the dielectric tip-surface gap on these interactions.",

author = "Eliseev, {Eugene A.} and Morozovska, {Anna N.} and Ievlev, {Anton V.} and Nina Balke and Peter Maksymovych and Alexander Tselev and Kalinin, {Sergei V.}",

year = "2014",

month = jun,

day = "9",

doi = "10.1063/1.4882861",

language = "English",

volume = "104",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

number = "23",

}

TY - JOUR

T1 - Electrostrictive and electrostatic responses in contact mode voltage modulated scanning probe microscopies

AU - Eliseev, Eugene A.

AU - Morozovska, Anna N.

AU - Ievlev, Anton V.

AU - Balke, Nina

AU - Maksymovych, Peter

AU - Tselev, Alexander

AU - Kalinin, Sergei V.

PY - 2014/6/9

Y1 - 2014/6/9

N2 - Electromechanical response of solids underpins image formation mechanism of several scanning probe microscopy techniques including the piezoresponse force microscopy (PFM) and electrochemical strain microscopy (ESM). While the theory of linear piezoelectric and ionic responses are well developed, the contributions of quadratic effects including electrostriction and capacitive tip-surface forces to measured signal remain poorly understood. Here, we analyze the electrostrictive and capacitive contributions to the PFM and ESM signals and discuss the implications of the dielectric tip-surface gap on these interactions.

AB - Electromechanical response of solids underpins image formation mechanism of several scanning probe microscopy techniques including the piezoresponse force microscopy (PFM) and electrochemical strain microscopy (ESM). While the theory of linear piezoelectric and ionic responses are well developed, the contributions of quadratic effects including electrostriction and capacitive tip-surface forces to measured signal remain poorly understood. Here, we analyze the electrostrictive and capacitive contributions to the PFM and ESM signals and discuss the implications of the dielectric tip-surface gap on these interactions.

UR - http://www.scopus.com/inward/record.url?scp=84902491488&partnerID=8YFLogxK

U2 - 10.1063/1.4882861

DO - 10.1063/1.4882861

M3 - Article

AN - SCOPUS:84902491488

SN - 0003-6951

VL - 104

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 23

M1 - 232901

ER -

Electrostrictive and electrostatic responses in contact mode voltage modulated scanning probe microscopies

Abstract

Access to Document

Other files and links

Fingerprint

Cite this