Electronic excitation in a catalytic support oxide, CeO2

E. Mamontov, W. Dmowski, T. Egami, C. C. Kao

Research output: Contribution to journalConference articlepeer-review

12 Scopus citations

Abstract

X-ray resonant Raman scattering (XRRS) measurements were performed on a single crystal of ceria, CeO2, near the Ce LIII edge. Ceria is an important component of automotive catalytic converters, and helps to maintain the oxygen pressure in the vicinity of metal catalysts through the valence change Ce4+↔Ce3+. The XRRS spectra show rich features of electronic excitations in ceria involving various f state occupations of cerium that change with temperature and/or surface composition. Determining the electronic process that leads to valence change would facilitate the understanding of the buffering function of ceria.

Original languageEnglish
Pages (from-to)431-433
Number of pages3
JournalJournal of Physics and Chemistry of Solids
Volume61
Issue number3
DOIs
StatePublished - Mar 2000
EventInternational Workshop on Inelastic X-ray Scattering - Long Island, NY, USA
Duration: Oct 18 1998Oct 21 1998

Funding

The research was supported by the US Department of Energy and the National Science Foundation through the Automotive Initiative Grant DE-FG02-96ER14682.A000. The authors are thankful to Prof. A. Kotani for communicating his results prior to publication. The experiment was carried out at the National Synchrotron Light Source, Brookhaven National Laboratory, which is supported by the US Department of Energy, Division of Materials Sciences and Division of Chemical Sciences.

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