Abstract
X-ray resonant Raman scattering (XRRS) measurements were performed on a single crystal of ceria, CeO2, near the Ce LIII edge. Ceria is an important component of automotive catalytic converters, and helps to maintain the oxygen pressure in the vicinity of metal catalysts through the valence change Ce4+↔Ce3+. The XRRS spectra show rich features of electronic excitations in ceria involving various f state occupations of cerium that change with temperature and/or surface composition. Determining the electronic process that leads to valence change would facilitate the understanding of the buffering function of ceria.
Original language | English |
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Pages (from-to) | 431-433 |
Number of pages | 3 |
Journal | Journal of Physics and Chemistry of Solids |
Volume | 61 |
Issue number | 3 |
DOIs | |
State | Published - Mar 2000 |
Event | International Workshop on Inelastic X-ray Scattering - Long Island, NY, USA Duration: Oct 18 1998 → Oct 21 1998 |
Funding
The research was supported by the US Department of Energy and the National Science Foundation through the Automotive Initiative Grant DE-FG02-96ER14682.A000. The authors are thankful to Prof. A. Kotani for communicating his results prior to publication. The experiment was carried out at the National Synchrotron Light Source, Brookhaven National Laboratory, which is supported by the US Department of Energy, Division of Materials Sciences and Division of Chemical Sciences.