Electron transfer and ionic displacements at the origin of the 2D electron gas at the LAO/STO interface: Direct measurements with atomic-column spatial resolution

Claudia Cantoni; Jaume Gazquez; Fabio Miletto Granozio; Mark P. Oxley; Maria Varela; Andrew R. Lupini; Stephen J. Pennycook; Carmela Aruta; Umberto Scotti Di Uccio; Paolo Perna; Davide MacCariello

doi:10.1002/adma.201200667

Electron transfer and ionic displacements at the origin of the 2D electron gas at the LAO/STO interface: Direct measurements with atomic-column spatial resolution

Claudia Cantoni, Jaume Gazquez, Fabio Miletto Granozio, Mark P. Oxley, Maria Varela, Andrew R. Lupini, Stephen J. Pennycook, Carmela Aruta, Umberto Scotti Di Uccio, Paolo Perna, Davide MacCariello

electron Microscopy and Microanalysis

Research output: Contribution to journal › Article › peer-review

135 Scopus citations

Abstract

Using state-of-the-art, aberration-corrected scanning transmission electron microscopy and electron energy loss spectroscopy with atomic-scale spatial resolution, experimental evidence for an intrinsic electronic reconstruction at the LAO/STO interface is shown. Simultaneous measurements of interfacial electron density and system polarization are crucial for establishing the highly debated origin of the 2D electron gas.

Original language	English
Pages (from-to)	3952-3957
Number of pages	6
Journal	Advanced Materials
Volume	24
Issue number	29
DOIs	https://doi.org/10.1002/adma.201200667
State	Published - Aug 2 2012

Keywords

charge transport
epitaxy
oxide interfaces
structure-property relationships
thin films

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10.1002/adma.201200667

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Cantoni, C., Gazquez, J., Miletto Granozio, F., Oxley, M. P., Varela, M., Lupini, A. R., Pennycook, S. J., Aruta, C., Di Uccio, U. S., Perna, P., & MacCariello, D. (2012). Electron transfer and ionic displacements at the origin of the 2D electron gas at the LAO/STO interface: Direct measurements with atomic-column spatial resolution. Advanced Materials, 24(29), 3952-3957. https://doi.org/10.1002/adma.201200667

@article{305ef7496bf94bc3992cda3a757d8928,

title = "Electron transfer and ionic displacements at the origin of the 2D electron gas at the LAO/STO interface: Direct measurements with atomic-column spatial resolution",

abstract = "Using state-of-the-art, aberration-corrected scanning transmission electron microscopy and electron energy loss spectroscopy with atomic-scale spatial resolution, experimental evidence for an intrinsic electronic reconstruction at the LAO/STO interface is shown. Simultaneous measurements of interfacial electron density and system polarization are crucial for establishing the highly debated origin of the 2D electron gas.",

keywords = "charge transport, epitaxy, oxide interfaces, structure-property relationships, thin films",

author = "Claudia Cantoni and Jaume Gazquez and {Miletto Granozio}, Fabio and Oxley, {Mark P.} and Maria Varela and Lupini, {Andrew R.} and Pennycook, {Stephen J.} and Carmela Aruta and {Di Uccio}, {Umberto Scotti} and Paolo Perna and Davide MacCariello",

year = "2012",

month = aug,

day = "2",

doi = "10.1002/adma.201200667",

language = "English",

volume = "24",

pages = "3952--3957",

journal = "Advanced Materials",

issn = "0935-9648",

publisher = "wiley",

number = "29",

}

Cantoni, C, Gazquez, J, Miletto Granozio, F, Oxley, MP, Varela, M, Lupini, AR, Pennycook, SJ, Aruta, C, Di Uccio, US, Perna, P & MacCariello, D 2012, 'Electron transfer and ionic displacements at the origin of the 2D electron gas at the LAO/STO interface: Direct measurements with atomic-column spatial resolution', Advanced Materials, vol. 24, no. 29, pp. 3952-3957. https://doi.org/10.1002/adma.201200667

TY - JOUR

T1 - Electron transfer and ionic displacements at the origin of the 2D electron gas at the LAO/STO interface

T2 - Direct measurements with atomic-column spatial resolution

AU - Cantoni, Claudia

AU - Gazquez, Jaume

AU - Miletto Granozio, Fabio

AU - Oxley, Mark P.

AU - Varela, Maria

AU - Lupini, Andrew R.

AU - Pennycook, Stephen J.

AU - Aruta, Carmela

AU - Di Uccio, Umberto Scotti

AU - Perna, Paolo

AU - MacCariello, Davide

PY - 2012/8/2

Y1 - 2012/8/2

N2 - Using state-of-the-art, aberration-corrected scanning transmission electron microscopy and electron energy loss spectroscopy with atomic-scale spatial resolution, experimental evidence for an intrinsic electronic reconstruction at the LAO/STO interface is shown. Simultaneous measurements of interfacial electron density and system polarization are crucial for establishing the highly debated origin of the 2D electron gas.

AB - Using state-of-the-art, aberration-corrected scanning transmission electron microscopy and electron energy loss spectroscopy with atomic-scale spatial resolution, experimental evidence for an intrinsic electronic reconstruction at the LAO/STO interface is shown. Simultaneous measurements of interfacial electron density and system polarization are crucial for establishing the highly debated origin of the 2D electron gas.

KW - charge transport

KW - epitaxy

KW - oxide interfaces

KW - structure-property relationships

KW - thin films

UR - http://www.scopus.com/inward/record.url?scp=84864401952&partnerID=8YFLogxK

U2 - 10.1002/adma.201200667

DO - 10.1002/adma.201200667

M3 - Article

C2 - 22711448

AN - SCOPUS:84864401952

SN - 0935-9648

VL - 24

SP - 3952

EP - 3957

JO - Advanced Materials

JF - Advanced Materials

IS - 29

ER -

Electron transfer and ionic displacements at the origin of the 2D electron gas at the LAO/STO interface: Direct measurements with atomic-column spatial resolution

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Keywords

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