Electron Microscopy of Transformation Induces Lattice Distortions in TiHfZrNb0.3 Refractory High Entropy Alloys

Kaijun Yin; Xuesong Fan; Lia Amalia; Peter K. Liaw; Jian Min Zuo

doi:10.1093/mam/ozae044.654

Electron Microscopy of Transformation Induces Lattice Distortions in TiHfZrNb_0.3 Refractory High Entropy Alloys

Kaijun Yin
, Xuesong Fan
, Lia Amalia
, Peter K. Liaw
, Jian Min Zuo

Research output: Contribution to journal › Conference article › peer-review

Original language	English
Pages (from-to)	1324-1325
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	30
Issue number	2024
DOIs	https://doi.org/10.1093/mam/ozae044.654
State	Published - Jul 24 2024
Externally published	Yes
Event	82nd Annual Meeting Microscopy Society of America and the 58th Annual Meeting Microanalysis Society, M and M 2024 - Cleveland, United States Duration: Jul 28 2024 → Aug 1 2024

Funding

Work supported by NSF, the Metals and Metallic Nanostructures Program (MMN) within the Division of Materials Research (DMR-2226495).

Access to Document

10.1093/mam/ozae044.654

Cite this

@article{a48923bf26454521b2c7bd160ba03916,

title = "Electron Microscopy of Transformation Induces Lattice Distortions in TiHfZrNb0.3 Refractory High Entropy Alloys",

author = "Kaijun Yin and Xuesong Fan and Lia Amalia and Liaw, \{Peter K.\} and Zuo, \{Jian Min\}",

year = "2024",

month = jul,

day = "24",

doi = "10.1093/mam/ozae044.654",

language = "English",

volume = "30",

pages = "1324--1325",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

number = "2024",

note = "82nd Annual Meeting Microscopy Society of America and the 58th Annual Meeting Microanalysis Society, M and M 2024 ; Conference date: 28-07-2024 Through 01-08-2024",

}

TY - JOUR

T1 - Electron Microscopy of Transformation Induces Lattice Distortions in TiHfZrNb0.3 Refractory High Entropy Alloys

AU - Yin, Kaijun

AU - Fan, Xuesong

AU - Amalia, Lia

AU - Liaw, Peter K.

AU - Zuo, Jian Min

PY - 2024/7/24

Y1 - 2024/7/24

UR - https://www.scopus.com/pages/publications/85215676336

U2 - 10.1093/mam/ozae044.654

DO - 10.1093/mam/ozae044.654

M3 - Conference article

AN - SCOPUS:85215676336

SN - 1431-9276

VL - 30

SP - 1324

EP - 1325

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - 2024

T2 - 82nd Annual Meeting Microscopy Society of America and the 58th Annual Meeting Microanalysis Society, M and M 2024

Y2 - 28 July 2024 through 1 August 2024

ER -

Electron Microscopy of Transformation Induces Lattice Distortions in TiHfZrNb0.3 Refractory High Entropy Alloys

Funding

Access to Document

Other files and links

Cite this

Electron Microscopy of Transformation Induces Lattice Distortions in TiHfZrNb_0.3 Refractory High Entropy Alloys