Electron Microscopy of Transformation Induces Lattice Distortions in TiHfZrNb0.3 Refractory High Entropy Alloys

Kaijun Yin; Xuesong Fan; Lia Amalia; Peter K. Liaw; Jian Min Zuo

doi:10.1093/mam/ozae044.654

Electron Microscopy of Transformation Induces Lattice Distortions in TiHfZrNb_0.3 Refractory High Entropy Alloys

Kaijun Yin, Xuesong Fan, Lia Amalia, Peter K. Liaw, Jian Min Zuo

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Research output: Contribution to journal › Conference article › peer-review

Original language	English
Pages (from-to)	1324-1325
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	30
Issue number	2024
DOIs	https://doi.org/10.1093/mam/ozae044.654
State	Published - Jul 24 2024
Event	82nd Annual Meeting Microscopy Society of America and the 58th Annual Meeting Microanalysis Society, M and M 2024 - Cleveland, United States Duration: Jul 28 2024 → Aug 1 2024

Funding

Work supported by NSF, the Metals and Metallic Nanostructures Program (MMN) within the Division of Materials Research (DMR-2226495).

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10.1093/mam/ozae044.654

Cite this

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title = "Electron Microscopy of Transformation Induces Lattice Distortions in TiHfZrNb0.3 Refractory High Entropy Alloys",

author = "Kaijun Yin and Xuesong Fan and Lia Amalia and Liaw, {Peter K.} and Zuo, {Jian Min}",

year = "2024",

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doi = "10.1093/mam/ozae044.654",

language = "English",

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journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

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note = "82nd Annual Meeting Microscopy Society of America and the 58th Annual Meeting Microanalysis Society, M and M 2024 ; Conference date: 28-07-2024 Through 01-08-2024",

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TY - JOUR

T1 - Electron Microscopy of Transformation Induces Lattice Distortions in TiHfZrNb0.3 Refractory High Entropy Alloys

AU - Yin, Kaijun

AU - Fan, Xuesong

AU - Amalia, Lia

AU - Liaw, Peter K.

AU - Zuo, Jian Min

PY - 2024/7/24

Y1 - 2024/7/24

UR - http://www.scopus.com/inward/record.url?scp=85215676336&partnerID=8YFLogxK

U2 - 10.1093/mam/ozae044.654

DO - 10.1093/mam/ozae044.654

M3 - Conference article

AN - SCOPUS:85215676336

SN - 1431-9276

VL - 30

SP - 1324

EP - 1325

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - 2024

T2 - 82nd Annual Meeting Microscopy Society of America and the 58th Annual Meeting Microanalysis Society, M and M 2024

Y2 - 28 July 2024 through 1 August 2024

ER -

Electron Microscopy of Transformation Induces Lattice Distortions in TiHfZrNb0.3 Refractory High Entropy Alloys

Funding

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Electron Microscopy of Transformation Induces Lattice Distortions in TiHfZrNb_0.3 Refractory High Entropy Alloys