Original language | English |
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Pages (from-to) | 662-663 |
Number of pages | 2 |
Journal | Microscopy and Microanalysis |
Volume | 9 |
Issue number | SUPPL. 2 |
DOIs | |
State | Published - 2003 |
Electron microscopy of thin-film Y2O3-stabilized ZrO2 and CeO2 on MgO
J. Bentley, P. F. Becher, I. Kosacki, C. M. Rouleau
Research output: Contribution to journal › Article › peer-review