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Electron-impact dissociation of XH2+ (X=B, C, N, O, F): Absolute cross sections for production of XH+ and X+ fragment ions

  • M. Fogle
  • , E. M. Bahati
  • , M. E. Bannister
  • , S. H.M. Deng
  • , C. R. Vane
  • , R. D. Thomas
  • , V. Zhaunerchyk

Research output: Contribution to journalArticlepeer-review

4 Scopus citations

Abstract

Absolute cross sections for electron-impact dissociation of XH2+ (X= B, C, N, O, F) producing XH+ and X+ ion fragments were measured in the 3- to 100-eV range using a crossed-electron-ion beams technique. Dissociative excitation of BD2+ and CH2+ producing B+ and C+, respectively, show a propensity toward a two-body dissociation while the remaining species all tend to show a three-body dissociation dynamic. The BD+ and CH+ dissociative excitation channels show a large resonant-type contribution to the cross sections at 10 eV. For the X + fragment ion production cross sections, a clear dependence on the threshold energy, as it relates to the rate of rise in the cross section above threshold, is observed.

Original languageEnglish
Article number042720
JournalPhysical Review A - Atomic, Molecular, and Optical Physics
Volume82
Issue number4
DOIs
StatePublished - Oct 26 2010

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