Electroluminescence from Au/extra-thin Si-rich SiO2 film/n+-Si under reverse biases and its mechanism

  • A. P. Li
  • , G. F. Bai
  • , K. M. Chen
  • , Z. C. Ma
  • , W. H. Zong
  • , Y. X. Zhang
  • , G. G. Qin

Research output: Contribution to journalArticlepeer-review

8 Scopus citations

Abstract

We have fabricated Au/extra-thin Si-rich SiO2 (ETSSO) film/p-Si and Au/ETSSO/n+-Si structures and compared their electroluminescence (EL) characteristics. It is found that for the Au/ETSSO/p-Si structure, when the forward bias (a positive voltage is applied to the p-Si substrate with respect to the Au electrode) is larger than 4 V, red light emission is observed, while under bias reverses, no light is emitted. The Au/ETSSO/n+-Si structure does not emit light under the forward bias (a positive voltage is applied to the Au electrode with respect to the n+-Si substrate), but it emits red light when the reverse bias is greater than a critical value, which correlates with the thickness of the ETSSO film. We have suggested a model for the electroluminescence mechanism of Au/ETSSO/n+-Si structures.

Original languageEnglish
Pages (from-to)137-139
Number of pages3
JournalThin Solid Films
Volume325
Issue number1-2
DOIs
StatePublished - Jul 18 1998
Externally publishedYes

Funding

This work was supported by National Natural Science Foundation of China and National Integrated Optoelectronic Laboratory of China.

Keywords

  • Gold
  • Luminescence
  • Silicon oxide
  • Structural properties

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