Electrical breakdown in helium cells at low temperature

B. Sethumadhavan; W. Yao; Y. H. Huang; R. E. Lanou; H. J. Maris; G. M. Seidel

doi:10.1103/PhysRevLett.97.015301

Electrical breakdown in helium cells at low temperature

B. Sethumadhavan, W. Yao, Y. H. Huang, R. E. Lanou, H. J. Maris, G. M. Seidel

Research output: Contribution to journal › Article › peer-review

6 Scopus citations

Abstract

Electrical breakdown of partially filled helium cells below 0.5K is shown to be the result of Penning ionization of metastable triplet helium excimers bound to the surface of the liquid.

Original language	English
Article number	015301
Journal	Physical Review Letters
Volume	97
Issue number	1
DOIs	https://doi.org/10.1103/PhysRevLett.97.015301
State	Published - 2006
Externally published	Yes

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10.1103/PhysRevLett.97.015301

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@article{3b393ff218f8445e8ed6658cad828692,

title = "Electrical breakdown in helium cells at low temperature",

abstract = "Electrical breakdown of partially filled helium cells below 0.5K is shown to be the result of Penning ionization of metastable triplet helium excimers bound to the surface of the liquid.",

author = "B. Sethumadhavan and W. Yao and Huang, {Y. H.} and Lanou, {R. E.} and Maris, {H. J.} and Seidel, {G. M.}",

year = "2006",

doi = "10.1103/PhysRevLett.97.015301",

language = "English",

volume = "97",

journal = "Physical Review Letters",

issn = "0031-9007",

publisher = "American Physical Society",

number = "1",

}

TY - JOUR

T1 - Electrical breakdown in helium cells at low temperature

AU - Sethumadhavan, B.

AU - Yao, W.

AU - Huang, Y. H.

AU - Lanou, R. E.

AU - Maris, H. J.

AU - Seidel, G. M.

PY - 2006

Y1 - 2006

N2 - Electrical breakdown of partially filled helium cells below 0.5K is shown to be the result of Penning ionization of metastable triplet helium excimers bound to the surface of the liquid.

AB - Electrical breakdown of partially filled helium cells below 0.5K is shown to be the result of Penning ionization of metastable triplet helium excimers bound to the surface of the liquid.

UR - http://www.scopus.com/inward/record.url?scp=33745764314&partnerID=8YFLogxK

U2 - 10.1103/PhysRevLett.97.015301

DO - 10.1103/PhysRevLett.97.015301

M3 - Article

AN - SCOPUS:33745764314

SN - 0031-9007

VL - 97

JO - Physical Review Letters

JF - Physical Review Letters

IS - 1

M1 - 015301

ER -

Electrical breakdown in helium cells at low temperature

Abstract

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